High bandwidth high speed analog-to-digital converter batch production testing device based on crystal oscillator and method thereof

Abstract

The invention belongs to the integrated circuit technology field and discloses a device of using a crystal oscillator to realize a high bandwidth high speed analog-to-digital converter batch production test in automatic test equipment. The device comprises the automatic test equipment 1 and a test support plate 3 which comprises a tested analog-to-digital converter chip 12, crystal oscillators 6, filters 7, a transformer 8, a relay 9, a crystal oscillator 10 and a filter circuit 11. The crystal oscillators 6 connect with the filters 7 respectively, and connect with the relay 9, the transformer 8, and the tested analog-to-digital converter chip 12 sequentially. The crystal oscillator 10 connects with the tested analog-to-digital converter chip 12. The device also comprises a metal spring needle set 2, one end of the metal spring needle set 2 connects with a test support plate 3, and the other end of the metal spring needle set 2 connects with the automatic test equipment 1. One end of the filter circuit 11 connects with the tested analog-to-digital converter chip 12, and the other end of the filter circuit 11 connects with the automatic test equipment 1 through the metal spring needle set 2. According to the device and the method in the invention, by utilizing excellent performance of the crystal oscillator, a stable, reliable ADC test capable of batch production is realized, and the device and the method are very suitable for mass production.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a method and device for mass production testing of high-bandwidth and high-speed analog-to-digital converters. Background technique [0002] With the rapid development of electronic communication technology and the continuous improvement of integrated circuit manufacturing technology, the introduction of new materials and the continuous advancement of digital signal processing technology, high-speed analog-to-digital converters (Analog-to-Digital Converter, referred to as ADC) are widely used in digital signals The processing system replaces the traditional analog signal processing method with real-time digital signal processing. High-speed ADCs are widely used in radar, measurement and control, high-speed data transmission, and other high-speed data acquisition systems and broadband digital receiving systems. Especially when digital technology is widely used in vari...

AI Technical Summary

Problems solved by technology

[0010] In order to overcome the lack of performance of the existing ATE itself, the defect that high-bandwidth and high-speed ADCs cannot be tested at full speed, the purpose of the present invention is to provide a mass production test method and device for realizing high-bandwidth and high-speed ADCs on ATEs during mass production , in order to achieve the above object, technical scheme of the present invention is as follows:

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