Correlation interferometric methods, devices and systems for low cost and rugged spectroscopy

Abstract

A correlation interferometric spectroscopy devices are described that detect the spectral characteristics of a sample wherein device consists of an electromagnetic radiation source for exciting a sample with photons; and a detector adapted to detect an arrival time of a photon at the detector and further adapted to detect a delay between the arrival time of different photons. The device may further consist of an autocorrelator adapted to analyze the between the arrival of photons at the detector. The device may also be used together with other spectral detection and characterizing systems, such as Raman spectroscopy and attenuated total reflectance spectroscopy. Also provided herein are methods, systems, and kits incorporating the correlation interferometric spectroscopy device.

Description

[0001] cross reference [0002] This application claims the benefit of US Provisional Patent Application No. 61 / 146,166, filed January 21, 2009, which is hereby incorporated by reference. technical field [0003] The measurement of the electromagnetic correlation of optical wavelengths can be done both electrically and optically by measuring the delay between the arrival of photons at high-speed detectors. This field of study is known as correlation interferometry and is the subject of the present disclosure. Background technique [0004] Interferometers used in spectrometers are instruments that require high precision during manufacture. Must be fitted and maintained with an accuracy much smaller than the wavelength. While such tolerances are common in today's optical structures, it is prohibitively expensive to fabricate instruments that meet such small tolerances, especially if one or more components must be moved while maintaining this accuracy, such as scanning Miche...

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Problems solved by technology

If this could be done, instruments with such parts would be more durable

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