Self auto-calibration of analog circuits in a mixed signal integrated circuit device

An integrated circuit and automatic calibration technology, which is applied to DC-coupled DC amplifiers, amplifiers with semiconductor devices/discharge tubes, electrical components, etc., can solve problems such as inability to effectively perform analog functions, online calibration, and extra, to achieve Effect of reducing circuit and die area

Active Publication Date: 2011-09-14
MICROCHIP TECH INC
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This creates additional problems because the equipment used to test digital microcontroller functions cannot effectively perform in-circuit calibration of analog functions
Therefore, additional test equipment and test steps are required during manufacture

Method used

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  • Self auto-calibration of analog circuits in a mixed signal integrated circuit device
  • Self auto-calibration of analog circuits in a mixed signal integrated circuit device
  • Self auto-calibration of analog circuits in a mixed signal integrated circuit device

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Embodiment Construction

[0024]Reference is now made to the drawings, which schematically illustrate details of example embodiments. In the drawings, the same elements will be represented by the same numerals, and similar elements will be represented by the same numerals with different lowercase letter suffixes.

[0025] refer to figure 1 , which depicts a schematic block diagram of a self-auto-calibration apparatus for a differential input operational amplifier according to a specific example embodiment of the present invention. The self-calibrating device 102 includes an analog portion 200 (see figure 2 ) and the numeral part 300 (see image 3 ). Analog section 200 includes input differential pair 114, gain and compensation circuit 108 for differential input operational amplifier and output buffer 110, voltage offset compensation digital-to-analog converter (DAC) 112, input load 106, tail current circuit 116, calibration voltage Reference AND buffer 118 and voltage comparator 120 . Digital ca...

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Abstract

Auto-calibration of the analog circuits occurs when requested by a user and / or the occurrence of an event(s). The user may invoke an auto-calibration on demand through an auto-calibration (ACAL ) input to the mixed-signal integrated circuit. An external voltage calibration (VCAL ) input may be used for auto-calibration of the mixed-signal integrated circuit to a user-supplied common-mode voltage reference. Auto-calibration of the mixed- signal integrated circuit may also be initiated upon the occurrence of any one or more of the following events: 1 ) detection of auto-calibration data corruption, e.g., parity checking of auto-calibration data values digitally stored in the mixed-signal integrated circuit; 2) an internal timer that causes a calibration request after a programmable timeout period, 3) change in the internal integrated circuit die temperature as determined by a temperature sensor, and 4) a change in the power supply and / or internal supply voltage(s).

Description

[0001] Related Application Cross Reference [0002] This application claims "Self-Auto-Calibration of Analog Circuits in Mixed-Signal Integrated Circuit Devices" filed Oct. 27, 2008 by James B. Nolan and Kumen Blake (Self Auto-Calibration of Analog Circuits in a Mixed Signal Integrated Circuit Device)" 61 / 108,638 commonly owns priority to US Provisional Patent Application and is incorporated herein by reference for all purposes. technical field [0003] The present invention relates to integrated circuits having analog input devices, and more particularly to an automatic calibration circuit for minimizing input offset voltage in integrated circuit analog input devices. Background technique [0004] Integrated circuits are becoming more sophisticated and continue to fall in price. Combinations of both analog and digital functions are fabricated on an integrated circuit die or packaged in a multi-chip package (MCP) is becoming more common and further increases usability and ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03F3/45
CPCH03F3/45977H03F2200/294H03M1/12H03F2200/261H03M1/1009H03F3/45475H03F3/195H03F2203/45136H03F2203/45048H03F2200/451
Inventor 詹姆斯·B·诺兰库门·布莱克
Owner MICROCHIP TECH INC
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