Spectral analysis method

Abstract

The embodiment of the invention relates to a spectral analysis method in the filed of elemental spectral analysis, which comprises the following steps of: locking the peak of a spectral peak as the mean initial value of a Gaussian function by using a peak-detection algorithm; using a peak value corresponding to the peak position of the spectral peak as a coefficient initial value of the Gaussian function; calculating the errors of a fit spectral peak area and the original spectral peak area under all spectral peak widths in the range of the whole energy spectrum, and calculating a variance initial value of the Gaussian function according to the spectral peak width corresponding to the error minimum; calculating the error of the fit spectral peak area and the original spectral peak area under each value of the mean value, the coefficient and the variance in the value range of the mean value, the coefficient and the variance, and calculating the mean value, coefficient and variance corresponding to the minimized error in all the errors to serve as the final characteristic parameters of the Gaussian function; and performing the spectral analysis by using the Gaussian function corresponding to the final characteristic parameters. The spectral analysis method improves the reproducibility of the spectral peak, and provides more accurate and detailed data for subsequent elemental analysis and quantitative analysis.

Description

technical field [0001] The invention relates to the field of element spectrum analysis, in particular to an X-ray fluorescence spectrum analysis method. Background technique [0002] Fluorescence analysis technology is widely used in non-destructive rapid analysis and detection of elements in non-ferrous metals, cement, geological exploration, traceability and other industries. Among them, X-ray fluorescence spectrum analysis is the key to X-ray fluorescence analysis technology. Identifying spectral peaks and extracting characteristic parameters are important steps to analyze the elements and their contents of the measured object. If the elements of the measured object are complex, the corresponding matrix effect will be Seriously, there are interferences such as tailing, overlapping, and scattering background at the peak of the fluorescence spectrum, which distorts the peak and affects the accuracy of subsequent analysis. In addition, due to the existence of statistical fl...

AI Technical Summary

Problems solved by technology

Among them, X-ray fluorescence spectrum analysis is the key to X-ray fluorescence analysis technology. Identifying spectral peaks and extracting characteristic parameters are important steps to analyze the elements and their contents of the measured object. If the elements of the measured object are complex, the corresponding matrix effect will be Seriously, there are interferences such as tailing, overlapping, and scattering background at the peak of the fluorescence spectrum, which distorts the peak and affects the accuracy of subsequent analysis

In addition, due to the existence of statistical fluctuations, the reproducibility of the spectral peaks obtained by measuring the same standard sample cannot be guaranteed under the condition of constant measurement conditions, which has a great impact on the measurement accuracy of low-content and granular samples.

[0003] Therefore, the existing X-ray fluorescence spectroscopic analysis technology is not accurate enough for the positioning and quantitative analysis of elements

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