A single-pulse method for measuring nonlinear refraction of materials

Abstract

The invention discloses a method for measuring the nonlinear refraction of a material with a single pulse. A phase object is added in the detection optical path. Under the action of a single pulse, the nonlinear transmittance of a small hole in the far field can be measured to determine the nonlinear refraction of the material. Linear index of refraction. The measurement system working according to the method of the invention has the advantages of simple optical path, simple data processing, single pulse measurement, no need to move the sample, can measure the magnitude and sign of nonlinear refraction at the same time, accurate measurement results, and greatly reduce the measurement cost.

Description

technical field [0001] The invention relates to a method for measuring optical nonlinear refraction of materials, belonging to the fields of nonlinear photonic materials and nonlinear optical information processing. Background technique [0002] With the rapid development of technologies in the fields of optical communication and optical information processing, the research on nonlinear optical materials is becoming increasingly important. The realization of functions such as optical logic, optical memory, optical transistor, optical switch and phase complex conjugation mainly depends on the research progress of nonlinear optical materials. [0003] Optical nonlinear measurement technology is one of the key technologies for studying nonlinear optical materials. Commonly used measurement methods include Z-scan, 4f system coherent imaging technology, Mach-Zehnder interferometry, four-wave mixing, third harmonic nonlinear interferometry, ellipsometry, phase object Z-scan, etc....

AI Technical Summary

Problems solved by technology

However, this method requires complex processing of the collected images, the detector needs to use CCD, and the requirements for CCD are relatively high, which increases the cost of measurement

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