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Measurement method of critical current properties of high-temperature superconducting tape

A technology of high-temperature superconducting strips and critical currents, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, and can solve problems such as inapplicability and inability to consider the impact

Active Publication Date: 2009-06-03
CHINA ELECTRIC POWER RES INST +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The traditional four-lead method is not applicable because it cannot consider the influence of these factors

Method used

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  • Measurement method of critical current properties of high-temperature superconducting tape
  • Measurement method of critical current properties of high-temperature superconducting tape
  • Measurement method of critical current properties of high-temperature superconducting tape

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Embodiment Construction

[0025] like Figure 5 As shown, the device for applying the method of the present invention includes a superconducting tape sample holder 1, a Hall magnetic field probe 2, a temperature probe 3, a background magnetic field magnet 4, a rotating rod 5, a rotating handle 6, and a superconducting tape current lead 7. Background magnetic field magnet current leads 8, low temperature Dewar 9, cooling medium storage container 10, low temperature cooling medium 11, exhaust valve 12, vaporizer 13, vacuum unit 14, GM refrigerator 15, back field magnet DC power supply 16, super DC power supply 17, system control, data acquisition and processing system 18. Among them, the cooling medium storage container, exhaust valve, vaporizer, vacuum unit, GM refrigerator, DC power supply, system control, data acquisition and processing system are placed at room temperature. Superconducting tape sample holder, Hall magnetic field probe, temperature probe, background magnetic field magnet, rotating ro...

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Abstract

The invention provides a measurement method of critical current properties of a high-temperature superconducting tape. The measurement method comprises the following steps: a vacuum unit is firstly utilized to carry out vacuum pumping of a low-temperature dewar through a decompression and cooling system, the test temperature range of the superconducting tape with 64K-77K is obtained, a certain DC current is introduced to a coil of a background magnetic field magnet through a current lead wire after reaching the expected temperature, the magnetic induction intensity of air gap can be obtained according to a calibration value, then a rotary handle above the outside of a dewar cover is rotated degree-by-degree at a certain temperature and a certain background magnetic field to drive a sample rack to rotate within the range of 0-90 degrees, the four-probe method is adopted under the different rotation angles, a system control, data acquisition and processing system is utilized to measure the critical current properties of the high-temperature superconducting tape, and a data file is further formed for output. The measurement method can simply and rapidly calculate the temperature, the background magnetic field and the impact factors on the change of the direction of the magnetic field thereof, thereby being applicable to the measurement of the critical current properties of the yttrium barium copper oxide YBCO high-temperature superconducting tape.

Description

technical field [0001] The invention relates to a method for measuring the critical current characteristics of the second-generation high-temperature superconducting strip, in particular to a method for realizing the measurement of the critical current characteristic of the yttrium-based oxide YBCO superconducting strip in different temperature ranges, under different background magnetic fields and magnetic field directions . Background technique [0002] In 1991, Fujikura of Japan used ion beam assisted deposition (IBAD) to obtain a layer of highly textured yttrium-stabilized zirconia ( YSZ) film, and then pulsed laser deposition (PLD) process was used to epitaxially deposit yttrium oxide YBCO on the baseband coating, announcing the advent of the second generation of high-temperature superconducting tape. Subsequently, the Los Alamos Laboratory (LANL) in the United States optimized these processes and announced in 1995 that the superconducting critical current density at 7...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R33/02
Inventor 诸嘉慧张宏杰魏斌
Owner CHINA ELECTRIC POWER RES INST
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