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Measurement device of critical current properties of high-temperature superconducting tape

A high-temperature superconducting tape, critical current technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of inapplicability and inability to consider the impact, and achieve the effect of complete functions and remote control.

Active Publication Date: 2009-06-03
CHINA ELECTRIC POWER RES INST +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The traditional four-lead method is not applicable because it cannot consider the influence of these factors

Method used

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  • Measurement device of critical current properties of high-temperature superconducting tape
  • Measurement device of critical current properties of high-temperature superconducting tape
  • Measurement device of critical current properties of high-temperature superconducting tape

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Experimental program
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Embodiment Construction

[0027] Such as Figure 5 As shown, the device applying the method of the present invention comprises a superconducting tape sample holder 1, a Hall magnetic field probe 2, a temperature probe 3, a background magnetic field magnet 4, a rotating rod 5, a rotating handle 6, a superconducting tape current lead 7, a background Magnetic field magnet current leads 8, low temperature Dewar 9, cooling medium storage container 10, low temperature cooling medium 11, exhaust valve 12, vaporizer 13, vacuum unit 14, GM refrigerator 15, back field magnet DC power supply 16, superconducting DC power supply 17. System control, data acquisition and processing system 18. Among them, the cooling medium storage container, exhaust valve, vaporizer, vacuum unit, GM refrigerator, DC power supply, system control, data acquisition and processing system are placed at room temperature. Superconducting tape sample holder, Hall magnetic field probe, temperature probe, background magnetic field magnet, rot...

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Abstract

The invention provides a measurement device of critical current properties of a high-temperature superconducting tape, and the device comprises a superconducting tape sample rack 1, a Hall magnetic field probe 2, a temperature probe 3, a background magnetic field magnet 4, a rotary rod 5, a rotary handle 6, a superconducting tape current lead wire 7, a background magnetic field magnet current lead wire 8, a low-temperature dewar 9, a cooling medium storage container 10, a low-temperature cooling medium 11, an extraction valve 12, a carburetor 13, a vacuum unit 14, a GM refrigerator 15, a background magnetic field magnet DC power supply 16, a superconducting DC power supply 17 and a system control, data acquisition and processing system 18. The device can simply and rapidly calculate the temperature, the background magnetic field and the impact factors on the change of the direction of the magnetic field thereof, thereby being applicable to the measurement of the critical current properties of yttrium barium copper oxide YBCO high-temperature superconducting tape.

Description

technical field [0001] The present invention relates to a measuring device for the critical current characteristic of the second generation high temperature superconducting strip, in particular to a device for measuring the critical current characteristic of the yttrium oxide YBCO superconducting strip in different temperature ranges, different background magnetic fields and magnetic field directions . Background technique [0002] In 1991, Fujikura of Japan used ion beam assisted deposition (IBAD) to obtain a layer of highly textured yttrium-stabilized zirconia ( YSZ) film, and then pulsed laser deposition (PLD) process was used to epitaxially deposit yttrium oxide YBCO on the baseband coating, announcing the advent of the second generation of high-temperature superconducting tape. Subsequently, the Los Alamos Laboratory (LANL) in the United States optimized these processes and announced in 1995 that the superconducting critical current density at 77K temperature reached 1...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R33/02
Inventor 诸嘉慧丘明张宏杰
Owner CHINA ELECTRIC POWER RES INST
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