Connector

Abstract

The invention provides an edge connector which inserts into an insertion edge of an aging plate and is used for connecting the aging plate with a connection main board, the edge connector is provided with: a case, which is formed with an insertion gap inserting into the insertion edge; a plurality of first pins, which are arranged at the insertion gap to either be respectively formed with a first base connected with wiring of the connection main board in a direction of inserting into the insertion edge, namely, the front end side of insertion direction, or to be respectively formed with a first contact section contacted with and electrically connected with electrode bonding pads formed at the insertion edge in a direction of drawing out of the insertion edge, namely, the front end side of drawing-out direction; one or a plurality of second pins, which are arranged at the insertion gap to either be respectively formed with a second base connected with wiring of the connection main board at the front end side of the insertion direction, or to be respectively formed with a second contact section contacted with and electrically connected with the electrode bonding pads formed at the insertion edge at the front end side of drawing-out direction.

Description

technical field [0001] The invention relates to a connector and an aging system. Background technique [0002] A burn-in apparatus is known as an apparatus for performing a burn-in test, which is one of screening tests for removing initial defective products, for the appearance of initial defects in devices such as electronic parts. In this burn-in device, a burn-in board mounted with a plurality of semiconductor devices as devices under test (Device Under Test) is accommodated inside the burn-in device, a predetermined voltage is applied to give electrical stress, and at the same time, the air inside the burn-in device is heated to By applying thermal stress at a predetermined temperature, initial defects appear. [0003] In this kind of aging device, since the aging test is carried out for several hours to tens of hours, in order to improve the test efficiency, usually a plurality of tested devices are installed on one burn-in board, and the burn-in board is divided into ...

AI Technical Summary

Problems solved by technology

[0006] However, simply using multiple pins and multiple electrode pads to supply power to the burn-in board may result in insufficient current for the burn-in board during the burn-in test.

Of course, if the number of pins used for power supply is increased, the power that can be supplied to the burn-in board will also increase, but the number of pins of the edge connector is limited, and there is a restriction that the number of pins used for power supply cannot be easily increased

In addition, the method of adding additional connectors on the burn-in board and increasing the number of pins is also not preferable because it will increase the cost.

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