Method for preparing scanning electron microscope sample by ion beam bombing
An electron microscope and ion beam technology, applied in the preparation of test samples, measuring devices, instruments, etc., can solve the problems of loss of misleading and easy migration of information, and achieve the effect of no damage to the crystal structure
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[0012] Sample requirements: the surface is clean, smooth and free of oil stains.
[0013] Operation method: first place the sample on the sample stage, and the vacuum degree of the bombardment chamber reaches 2×10 -3 Pa meets the working conditions of ion bombardment. The sample is continuously filled with argon during the bombardment process, and the sample stage itself rotates 360 degrees.
[0014] Determine the angle (inclination) between the sample and the ion beam, select the ion gun bombardment voltage (Kv) and ion beam current (mA), and determine the bombardment time according to the purpose of the experiment. Experience has proved that the bombardment time for hard materials is longer, and for soft materials The bombardment time is shorter.
[0015] material name
[0016] glass fiber
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