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Defused reflection plate light spectrum corner reflection characteristic measuring systems for on orbit calibration

A technology of diffuse reflection plate and reflection characteristics, which is applied in the field of radiation calibration of spectroscopic instruments, can solve problems such as stray light interference, and achieve the effect of light system, weight reduction and impact reduction

Inactive Publication Date: 2008-07-09
CENT FOR SPACE SCI & APPLIED RES
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  • Abstract
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  • Application Information

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Problems solved by technology

[0006] The purpose of the present invention is: to solve the problem of measuring the spectral angular reflectance of the diffuse reflector in the prior art, the method using the interference filter can only carry out single-wavelength measurement, and solve the problem of stray light interference using the monochromator spectroscopic method problem, thereby providing a kind of diffuse reflector spectral angle used for on-star calibration of space spectroscopic instruments, composed of collimated light source, sample holder, rotating part, light collecting part, monochromator and photodetector, which is transmitted by optical fiber Measuring system for reflection properties

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  • Defused reflection plate light spectrum corner reflection characteristic measuring systems for on orbit calibration

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Embodiment Construction

[0031] The present invention is shown in Figure 1 and Figure 2. The system consists of a two-dimensional rotating part, a sample holder, a light collecting part 6, an optical fiber bundle 7, a monochromator 8, a photoelectric detector 9, a mounting plate 10 and a collimated light source. The two-dimensional rotating system includes a first turntable 1 , a second turntable 2 and a third turntable 3 . The sample holder consists of a support rod 4 and a sample mounting plate 5 . The collimated light source is located in the vertical drawing direction of Fig. 1 and is not drawn in Fig. 1; its composition is shown in Fig. 2, including collimating mirror 2-1, deuterium lamp 2-2 and deuterium lamp power supply 2-3.

[0032]The two-dimensional rotating part is used to realize the two-dimensional rotation of the diffuse reflection plate to be tested relative to the parallel irradiation light beam from the collimated light source and the setting of the reflection angle of the diffuse r...

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Abstract

The invention relates to a measurement system for measuring corner reflection characteristics of a diffuse reflection plate used in calibration of spectrum instruments in satellite. A collimated light source is horizontally disposed; a first rotary table is disposed on a testing platform, a second rotary table is fixed on the first rotary table, and a third rotary table is disposed on the second rotary table; a sample rack is composed of a support bar and a sampling installing plate, one end of the support bar is fixed on the third rotary table, and the other end is fixed on the sample installing plate; a condensing lens is fixed in a lens barrel; one end of an optical fiber bundle is disposed at the focal point of the condensing lens, and the other end is disposed at the entrance slit of a monochrometer; the monochrometer is disposed on the testing platform and controlled by a computer; and a photoelectric detector is used for receiving the measurement signal. The spectral curve of a reflected light from a diffuse reflection plate with a certain incident angle can be obtained through wavelength scanning by the monochrometer. The measurement to the intensity of the reflection spectra from a diffuse reflection plate with different incident angles can be implemented by sequential rotation of the first and the second rotary tables, and the processed measured intensity is the corner reflection characteristic value of the diffuse reflection plate.

Description

technical field [0001] The invention relates to the field of radiation calibration of spectroscopic instruments, in particular to a measurement system for spectral angular reflection characteristics of a diffuse reflection plate used for on-board calibration of space spectroscopic instruments. Background technique [0002] Diffuse reflector is an important optical element in radiometric calibration of spectroscopic instruments. Especially in the ultraviolet and visible bands on satellites, diffuse reflectors are often used to introduce stable light sources, such as sunlight, into the optical path of spectrometers to calibrate the spectrometers, monitor changes in spectrometers, and use them to calibrate measurement results. . Considering the movement of the sun on the ecliptic throughout the year, the irradiation angle of sunlight on the diffuse reflector on the star is constantly changing. Therefore, the measurement of the spectral angular reflection characteristics of the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45G01J3/26G01M11/02
Inventor 张仲谋王咏梅王英鉴杜国军付利平李聪
Owner CENT FOR SPACE SCI & APPLIED RES
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