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Time sharing test approach for tester

A test method and tester technology, applied in monitoring/monitoring/test arrangement, instrumentation, error detection/correction, etc., can solve problems such as low test efficiency and low resource utilization, and achieve the effect of improving test efficiency and reducing costs

Active Publication Date: 2008-01-02
ELECTRIC POWER SCI RES INST OF STATE GRID XINJIANG ELECTRIC POWER
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a method for testing multiple measured objects at the same time by using the time-sharing feature, which solves the problem of low test efficiency and low resource utilization of traditional testers when facing some measured objects. problems, significantly improved the test efficiency and improved the utilization rate of the tester

Method used

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  • Time sharing test approach for tester

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Embodiment Construction

[0038] Below in conjunction with accompanying drawing, the implementation of technical scheme is described in further detail:

[0039] With this invention, the upper computer software of the tester generally consists of a test module and support software. The test module completes functions related to the test business, and the support software completes auxiliary functions, such as interface display and data access.

[0040] Generally, the upper computer software initiates the test command, but the actual test is completed by the lower computer and the object under test. The lower computer is a special test hardware device or test instrument with processing capability, which can cooperate with the measured object to complete the real test. During parallel testing, the resources of the lower computer support simultaneous testing of several objects under test.

[0041] In the test of the CDMA base station clock single board, the lower computer communicates with the upper compu...

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Abstract

The invention discloses a time-sharing test method used in tester, comprising that according to the test character and method of tested object, dividing the test process of the tested object into independent sequential test items, dividing the software processing time of superior machine, in single time sheet, the superior machine only communicates with one inferior machine, to complete all inferior machine communications, circulating until all tested objects are tested, the superior machine software inquires the completion of all tested objects, ending the test and receding the test program. The inventive method via time-sharing test can fully utilize superior machine, to interact with a plurality of inferior machines, and complete multiple tests, to improve test efficiency, compared with traditional tester which tests object one by one. The time-sharing test can fully utilize the resource of tester and reduce tester cost.

Description

technical field [0001] The invention relates to an automatic test method, in particular to a method for testing multiple measured objects in a communication tester. Background technique [0002] At present, most automated testers adopt a two-layer structure of upper computer and lower computer to complete the test and measurement of the measured object. The upper computer is generally composed of a computer and test monitoring software, which completes the generation and control of the test process, the access and display of test data information, and the interactive operation with the user; the lower computer is composed of special test hardware with certain processing capabilities. equipment or instruments. The upper computer of the tester realizes interactive communication with the lower computer through certain communication interfaces according to a certain communication protocol, and can also directly operate the lower computer of the tester through other interfaces. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04M3/24G06F11/00
Inventor 傅佳芳黄一川汪步江高延玲
Owner ELECTRIC POWER SCI RES INST OF STATE GRID XINJIANG ELECTRIC POWER
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