Flash memory device capable of improving read performance

a flash memory and read performance technology, applied in the field of semiconductor memory devices, can solve the problems of data errors in the read data being transferred, noise commonly associated with the provisioning of power voltages within the flash memory system, and noise associated with the initiation of main register operation

Inactive Publication Date: 2008-09-25
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0007]In one embodiment, the invention provides a flash memory device comprising; a memory cell array configured to store N-bit read data, where N is a positive integer, a page buffer circuit comprising a page buffer configured to receive read data from the memory cell array during a read operation, wherein the page buffer comprises a main register transferring read data to a cache register during the read operation, and a control logic block configured to control operation of the page buffer during the read operation such that initialization of the main register continuously extends beyond a time period during which read data is transferred from the main register to the cache register.
[0008]In another embodiment, the invention provides a method of performing a read operation in a flash memory device comprising a memory cell array; and a page buffer circuit comprising a page buffer, wherein the page buffer comprises a main register and a cache register, the method comprising; initiating operation of the main register, after transferring read data to the cache register, deactivating the main register, receiving a cache read command after deactivation of the main register, reactivating th...

Problems solved by technology

However, noise commonly associated with the provision of power voltages within the flash memory system occur during the output of the previous read data to the external circuit from the cache register.
In addition, noise associated with the initiation of main register operation is als...

Method used

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  • Flash memory device capable of improving read performance
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  • Flash memory device capable of improving read performance

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Embodiment Construction

[0016]Embodiments of the invention will now be described with reference to the accompanying drawings. The invention may, however, be variously embodied and should not be constructed as being limited to only the illustrated embodiments. Rather, the embodiments are provided as teaching examples.

[0017]FIG. 2 is a block diagram of a flash memory device adapted for use within a memory system according to an embodiment of the invention. In the illustrated embodiment, a NAND flash memory device is assumed for purposes of description, but those skilled in the art will understand that this is merely one example of a class of flash memory devices that might be used within embodiments of the invention.

[0018]Referring to FIG. 2, the flash memory device comprises a memory cell array 100 of conventional arrangement storing N-bit data, where N is a positive integer. A row selector 200 operates under the control of control logic block 600 to select and drive one or more rows within memory cell arra...

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Abstract

A flash memory device, related system ad method are disclosed. The memory device includes a memory cell array a page buffer receiving read data, wherein the page buffer includes a main register transferring read data to a cache register during an read operation, and a control logic block controlling operation of the page buffer during the read operation, such that initialization of the main register continuously extends beyond a time period during which read data is transferred from the main register to the cache register.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This U.S. non-provisional patent application claims priority under 35 U.S.C. § 119 to Korean Patent Application No. 10-2007-26658 filed on Mar. 19, 2007, the subject matter of which is hereby incorporated by reference.BACKGROUND OF THE INVENTION[0002]The present invention relates to semiconductor memory devices. More particularly, the invention relates to flash memory devices executing cache read functions.[0003]Driven by ever-growing demands for higher performance contemporary memory systems including flash memory devices have incorporated a cache read functionality. During a cache read operation, previous read data stored in a cache register is output to an external circuit while current read data is read from memory through a main register. An exemplary cache read operation will be described with reference to Figure (FIG.) 1.[0004]Referring to FIG. 1, a read command, a corresponding read data address, and a read operation start indicat...

Claims

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Application Information

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IPC IPC(8): G06F12/02
CPCG06F12/0893G11C16/26G06F2212/2022G11C16/0483
Inventor CHAE, DONG-HYUK
Owner SAMSUNG ELECTRONICS CO LTD
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