Method and device for measuring multiple spot dynamic flexibility/displacement by self caliberating self coding imaging method
A technology of displacement measurement and self-encoding, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the constraints of bridge real-time, all-weather, dynamic displacement monitoring applications, bridge dynamic position deflection/displacement measurement system is expensive and cannot be photographed and measurement of multiple targets, to avoid simultaneous measurement and processing, reduce image data transmission and processing, and achieve fast computing speed
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0023] The present invention will be further elaborated below in conjunction with accompanying drawing:
[0024] See attached image 3 , a multi-point dynamic deflection / displacement measurement device with self-calibration and self-encoding imaging method, including a target 1 installed on the measured target 2, a photoelectric camera system 3 and a computer 4, the target 1 is two regular shapes and a certain distance from each other light source. The light source is designed as a line light source. In digital image processing, it can usually be treated as a one-dimensional line. The positioning is accurate and the calculation speed is fast, which is conducive to improving the calculation speed. Because the yellow light source has a strong penetrating ability in foggy days, the light source is designed as a yellow line light source.
[0025] see Figure 4 , the line light source is installed on the surface of a light box 6, the surface is a black rough surface, to enhance ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com