Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

High and low temperature recycle unit with wide temperature range

A technology of high and low temperature cycle and temperature cycle, which is applied to thermometers, lighting and heating equipment, and thermometers using electric/magnetic elements that are directly sensitive to heat, etc., can solve the problem of unreachable, high cost, and inability to automate temperature cycle tests and other issues to achieve the effect of avoiding losses and realizing automation

Inactive Publication Date: 2005-04-06
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
View PDF0 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The Stirling refrigerator can reach below -173°C, but if it is used for ground testing of infrared detectors, only one device can be tested for each test, which has low efficiency and high cost
At present, other semiconductor device temperature cycle equipment either cannot reach below -173°C, or cannot achieve temperature cycle under vacuum conditions, or require manpower for several months of manual operation, and cannot automate the temperature cycle test

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High and low temperature recycle unit with wide temperature range
  • High and low temperature recycle unit with wide temperature range
  • High and low temperature recycle unit with wide temperature range

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The following is based on Figure 1 to Figure 9 Provide a better embodiment of the present invention, and in conjunction with the description to the embodiment, further provide the technical details of the present invention, can better illustrate the structural features and functional characteristics of the present invention, but are not used to limit the present invention Therefore, all embodiments that conform to the spirit of the scope of the present invention and similar changes should be included in the scope of the present invention.

[0027] see figure 1 As shown, the device of the present invention is composed of a master system and a slave system. The main system includes: vacuum container and heat transfer mechanism, temperature test circuit and computer screen display, motor drive and control mechanism, electric heater and control and display screen, cycle counting display screen, and equipment protection device; the slave system includes liquid nitrogen Ma...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

It is temperature recycle apparatus from high to low with large temperature range, which is main applied in man-made satellite infrared detector environment strain filtering. The apparatus comprises one main system, a slave system and a PC machine. The main system is responsible for temperature recycle and its control, while the slave system is for automatic compensation of liquid nitrogen of the cold environment of main system. The apparatus can record heat environment temperature and display the recycle times on the control panel.

Description

Technical field: [0001] The invention relates to reliability testing and environmental stress screening equipment for semiconductor devices, and is especially suitable for reliability testing of low-temperature semiconductor devices such as satellite infrared detectors. The temperature range is below -173°C to 300°C. Background technique: [0002] Due to the life of the Stirling refrigerator, in some cases, the satellite infrared detectors have adopted an intermittent working mode, so they will suffer from normal temperature (about 20°C) to low temperature (≤-173°C) in space. Thousands of temperature cycles. To this end, reliability verification must be carried out on the ground. A large number of engineering practices have proved that temperature cycling is the most effective screening mode in environmental stress screening, and the number of faults it stimulates accounts for more than half of the total faults in environmental stress screening. High and low temperature ci...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): F25B9/14G01D18/00G01K7/18G01M99/00G01R31/26
Inventor 吴礼刚朱三根龚海梅黄翌敏李向阳方家熊
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com