Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Element error correcting system for IC manufacture

A component error, integrated circuit technology, applied in the field of component error correction systems, can solve problems such as erroneous comparison of voltages, inability to correctly correct resistance errors, and inability to correctly establish standard current Iref, etc.

Inactive Publication Date: 2005-03-23
BENQ CORP
View PDF1 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the case of misalignment of the bias voltage Vcc, even if the voltage regulation generating circuit 530 can provide a stable voltage Vbg, the standard current Iref cannot be established correctly.
In this way, the wrong reference current Iref and the resistor Rc will generate a wrong comparison voltage Vc. When the analog / digital converter 550 compares the wrong comparison voltage Vc with the correct reference voltage Vref, naturally the resistance error cannot be corrected correctly.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Element error correcting system for IC manufacture
  • Element error correcting system for IC manufacture
  • Element error correcting system for IC manufacture

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] Please refer to FIG. 2 . FIG. 2 is a schematic diagram of the device error correction system 10 of the present invention applied to an RC filter circuit 70 . The component error correction system 10 includes a current generator 20 , which can generate two currents, which are respectively output to a reference voltage generator 30 and a voltage divider circuit 40 . The divided voltage of the voltage divider circuit 40 and the reference voltage generated by the reference voltage generator 30 are respectively input into two input terminals of a comparator circuit 50, and the comparison result is then input into a correction circuit 60 to control the correction circuit 60 to correct the filter circuit. 70 to make the necessary corrections. In this embodiment, the correction circuit 60 is equivalent to a variable capacitor, which is electrically connected to the filter circuit 70 in parallel. The comparison circuit 50 is used as an analog / digital conversion circuit for conv...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An element error correcting system used to correct the element error caused by manufacturing process in integrated circuit includes one current source, two currents with certain output proportion. A bleeder circuit formed on the integrated circuit includes at least one output end to receive a current from current source to output a dividing voltage, one reference voltage generator to receive an other current from current source for output of a reference voltage, one comparision circuit connecting with the output of blender circuit to receive the transmitted dividing voltage and to compare the dividing voltage with the reference voltage to create the corresponding comparision signal and a correcting circuit connected with comparision circuit to be used for correcting the element error on the integrated circuit according to the created comparision signal.

Description

technical field [0001] The invention provides a component error correction system, especially a correction system for correcting resistance errors caused by integrated circuit manufacturing processes. Background technique [0002] In today's era of advanced technology, integrated circuits have been widely used in all aspects of life, from small electronic watches and mobile phones to powerful supercomputers, traces of integrated circuits can be seen everywhere. However, due to problems in manufacturing process control, the characteristics of each component in the integrated circuit may deviate from the originally designed characteristics, making the overall performance of the integrated circuit not as ideal as originally designed. For example, resistive elements in integrated circuits may have errors due to imperfections in some manufacturing processes. Such a manufacturing process deviation will cause the actual resistance values ​​of all resistive elements in the integrat...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H03K5/00
Inventor 刘宇华
Owner BENQ CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products