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Surface defect detection method and equipment based on three-dimensional image

A technology for three-dimensional image and defect detection, which is applied in the field of image processing, can solve the problems of inability to obtain pixel height information, reduce the accuracy of surface defect detection, and low efficiency, and achieve the effects of real-time detection, improved efficiency, and less time-consuming

Pending Publication Date: 2022-08-09
SHENZHEN HUAHAN WEIYE TECH
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Problems solved by technology

The three-dimensional image data output by the 3D vision sensor can provide more abundant information for surface defect detection, but due to the influence of the acquisition environment, such as occlusion, reflection, multiple reflections, etc., it often leads to the inability to obtain the height information of the pixel point, that is to say Invalid pixels usually exist in the 3D image data output by the 3D vision sensor
At present, the invalid pixels in the 3D image data are mainly processed through image restoration processing or image filling processing, which is not only inefficient, but also reduces the accuracy of surface defect detection.

Method used

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  • Surface defect detection method and equipment based on three-dimensional image
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  • Surface defect detection method and equipment based on three-dimensional image

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Embodiment Construction

[0052]The present invention will be further described in detail below through specific embodiments in conjunction with the accompanying drawings. Wherein similar elements in different embodiments have used associated similar element numbers. In the following embodiments, many details are described so that the present application can be better understood. However, those skilled in the art will readily recognize that some of the features may be omitted in different situations, or may be replaced by other elements, materials, and methods. In some cases, some operations related to the present application are not shown or described in the specification, in order to avoid the core part of the present application from being overwhelmed by excessive description, and for those skilled in the art, these are described in detail. The relevant operations are not necessary, and they can fully understand the relevant operations according to the descriptions in the specification and general ...

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Abstract

The invention provides a surface defect detection method and equipment based on a three-dimensional image. The method comprises the following steps: obtaining structured three-dimensional image data of a target object; extracting primary features from the structured three-dimensional image data to obtain a primary feature map of the target object; performing multi-scale feature extraction on the primary feature map to obtain a multi-scale feature map as large as the primary feature map; processing the primary feature map by adopting a pre-trained invalid pixel mask prediction network to obtain mask data as large as the primary feature map; performing feature cutting on the multi-scale feature map according to the mask data to obtain a feature map corresponding to the effective pixel; extracting high-level features from the feature map corresponding to the effective pixels to obtain a high-level feature map of the target object; and performing defect classification processing according to the advanced feature map to obtain a defect classification result of the target object. And invalid pixels are filtered out on the feature level, so that the efficiency is improved, and the accuracy is improved.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of image processing, and in particular, to a method and device for detecting surface defects based on a three-dimensional image. Background technique [0002] Surface defects refer to defects such as spots, depressions, scratches, defects, cracks, etc. that exist on the surface of a product, which not only affect the appearance of the product, but also affect the quality and performance of the product. Therefore, the detection of surface defects is of great significance, and has been widely used in industrial production, such as welding seam inspection, wafer inspection, etc. [0003] With the continuous development of image processing technology, the method of automatic detection of surface defects based on image data has gradually replaced the early visual inspection method performed manually. With the complexity of machine vision scenarios, 3D vision sensors are gradually put into p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06V10/764G06V10/82G06N3/04G06N3/08G06V10/40
CPCG06T7/0004G06N3/084G06V10/764G06V10/82G06V10/40G06T2207/20084G06T2207/20081G06T2207/30108G06N3/045Y02P90/30
Inventor 祝树杰李杰明杨洋翟爱亭黄淦
Owner SHENZHEN HUAHAN WEIYE TECH
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