Method for measuring primary ray spectrum of X-ray tube

A measurement method and light tube technology, which is applied in the field of X-ray tube primary ray spectrum measurement, can solve problems such as interference and long measurement paths, and achieve the effects of improving accuracy, reducing measurement interference, and simple measurement methods

Pending Publication Date: 2022-06-24
ANHUI WAYEE SCI & TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In the prior art, the measurement method of X-ray primary energy spectrum often adopts crystal diffraction method, but this method has problems such as long measurement path and many interferences

Method used

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  • Method for measuring primary ray spectrum of X-ray tube
  • Method for measuring primary ray spectrum of X-ray tube
  • Method for measuring primary ray spectrum of X-ray tube

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Embodiment 1

[0033] The present embodiment discloses a method for measuring the primary ray spectrum of an X-ray tube, which includes the following steps:

[0034] S1. Place the X-ray tube, the first aluminum plate, and the detector in sequence, and the exit port of the X-ray tube and the entrance port of the detector are respectively distributed on both sides of the first aluminum plate with a thickness of D1.

[0035] In this embodiment, D1 is 5mm.

[0036] S2. After setting the X-ray tube, turn on the detector, and obtain the spectrum P1 through the detector.

[0037] When setting the X-ray tube, correct the position of the X-ray tube, and turn on the X-ray tube to make the X-ray tube emit X-rays.

[0038] S3. Remove the first aluminum plate, replace it with a second aluminum plate with a thickness of D2, and re-test to obtain a spectrum P2.

[0039] In this embodiment, D2 is 3 mm.

[0040] Wherein, the spectrum diagrams of the spectrogram P1 and the spectrogram P2 in this embodiment...

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Abstract

The invention discloses a method for measuring a primary ray spectrum of an X-ray tube. The method comprises the following steps: placing the X-ray tube, a first aluminum plate and a detector in sequence; after the X-ray tube is arranged, a spectrogram P1 is obtained through a detector; taking away the first aluminum plate, replacing the first aluminum plate with a second aluminum plate with the thickness of D2, and retesting to obtain a spectrogram P2; according to the energy calibration coefficient of the detector, the channel numbers of the spectrogram P1 and the spectrogram P2 are converted into energy values, and a spectrogram P3 is obtained; obtaining a spectrogram P4 of the rays emitted by the X-ray tube before being absorbed by the first aluminum plate or the second aluminum plate according to the absorption of the rays by the first aluminum plate and the second aluminum plate; and according to the beryllium window of the X-ray tube and the absorption of the air to the rays, obtaining a spectrogram P5 of the rays emitted by the X-ray tube before the rays are absorbed by the beryllium window and the air. According to the measurement method, the aluminum plate is adopted as a ray attenuation medium of the X-ray tube, the measurement path is short, interference is reduced in a differential mode, the measurement accuracy is high, and use is convenient.

Description

technical field [0001] The invention relates to a nondestructive testing technology, in particular to a method for measuring the primary ray spectrum of an X-ray tube. Background technique [0002] As a non-destructive testing method, X-ray fluorescence analysis (XRF) and X-ray diffraction analysis (XRD) are widely used in the qualitative and quantitative analysis of elements and film thickness measurement in the fields of geology, environment, metallurgy and food. Among them, the accuracy of the X-ray primary energy spectrum distribution seriously affects the accuracy of the final measurement and analysis. In the prior art, the measurement method of X-ray primary energy spectrum often adopts the crystal diffraction method, but this method has problems such as long measurement path and many interferences. SUMMARY OF THE INVENTION [0003] In order to solve the above-mentioned deficiencies in the prior art, the purpose of the present invention is to provide a method for me...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/223
CPCG01N23/223
Inventor 程依光
Owner ANHUI WAYEE SCI & TECH CO LTD
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