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Method and system for collecting and processing dynamic test data

A technology of dynamic testing and processing methods, applied in electrical digital data processing, special data processing applications, transmission systems, etc., can solve the problems of high secondary development cost, poor compatibility, etc., to achieve consistency and result tracking, and easy to use. The effect of good performance and simple structure

Pending Publication Date: 2022-05-13
SHANGHAI CHIPON MICRO ELECTRONICS CO LTD
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  • Abstract
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  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to overcome the defects of poor compatibility and high secondary development cost of the existing host computer system, and provide a method for collecting and processing dynamic test data, by which the host computer can simultaneously complete data in different communication data formats Consultation, collection and analysis, the protocol frame format can be set according to actual needs, that is, it can be applied to new test requirements

Method used

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  • Method and system for collecting and processing dynamic test data
  • Method and system for collecting and processing dynamic test data

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Embodiment Construction

[0030] The specific implementation manners of the present invention will be further elaborated below in conjunction with the accompanying drawings. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them.

[0031] This embodiment is a method for collecting and processing dynamic test data, and the method is applied to a host computer. Such as figure 1 As shown, the specific steps are as follows:

[0032] S101: Obtain basic information of at least one test device;

[0033] Including the data type, data length, data content of the chip test and whether the current chip is NG.

[0034] S102: The basic information is combined according to a specific format, and frame header information, checksum and frame tail information are added to generate a test communication protocol frame;

[0035]

[0036] Among them: the frame header and frame tail are specific signs agreed in advance, and the check adopts CRC-8. The basic i...

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Abstract

The invention discloses a dynamic test data collecting and processing method and system, and belongs to the technical field of integrated circuit chip data processing. The technical scheme comprises the following steps: acquiring basic information of at least one test device, wherein the basic information comprises a data type, a data length and a data content of a chip test and whether a current chip is NG or not; the basic information is combined according to a specific format, frame header information and check and frame tail information are added, and a test communication protocol frame is generated; the upper computer reads and analyzes the test communication protocol frame, and looks up, collects and analyzes the information of the test equipment; and receiving test data of the mass-produced chips, and storing the test data in a background database. According to the system and the method, data in different communication data formats can be looked up, collected and analyzed at the same time, consistency and result tracking of chip quality requirements in the integrated circuit industry are achieved, NG classification statistical analysis can be achieved, and the system and the method are high in flexibility and good in use convenience and have great application prospects.

Description

technical field [0001] The invention relates to the technical field of integrated circuit chip data processing, in particular to a method and system for collecting and processing dynamic test data compatible with multiple data types. Background technique [0002] In the integrated circuit industry, database-based data collection and analysis are usually based on specific project requirements, designing database models, and designing corresponding data receiving drives according to specific lower-level computer communication protocols. The current needs are usually entrusted by chip companies to software design companies to develop. This model needs to provide a complete demand description and application model, and the maintenance of later adjustments requires the company to be equipped with professional engineering personnel. At the same time, because different lower-level computers have different communication data formats, the secondary development generated when the dema...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F16/2458H04L69/22
CPCG06F16/2462H04L69/22
Inventor 叶玲玲郜建政
Owner SHANGHAI CHIPON MICRO ELECTRONICS CO LTD
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