Method and device for measuring parasitic inductance of direct-current support capacitor and readable storage medium
A technology of DC support capacitance and parasitic inductance, which is applied in the direction of measuring devices, inductance measurement, and measurement of electrical variables, can solve problems such as no role in guiding design, and achieve the effect of improving copper bar design and optimizing parasitic inductance
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[0036] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.
[0037] The present invention aims at the problem that most of the extraction methods of the parasitic inductance of the DC support capacitor in the prior art are double-pulse test and calculation after the sample comes out, which can only be used as a means of design verification and has no role in guiding the design, and provides a DC support capacitor parasitic Inductance measurement method, device and readable storage medium.
[0038] Such as figure 2 As shown, the embodiment of the present invention provides a method for measuring the parasitic inductance of the DC support capacitor, including:
[0039] Step 201, calculating the first parasitic inductance of the output port of the IGBT in the loop through the finite element algorithm;
[0040...
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