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Method and device for vectorizing measurement data of unidirectional scanning sensor

A technology for measuring data and sensors, which is applied in the field of single-directional scanning sensor measurement data vectorization methods and devices, can solve problems such as difficulty in taking advantage of advantages, inability to measure with complex features, and affecting processing accuracy, so as to improve applicability and measurement accuracy, Promoting application and advantage play, and solving the effect of insufficient applicability

Active Publication Date: 2022-05-31
BEIJING JINGDIAO GRP CO LTD
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Problems solved by technology

[0003] Due to the consideration of price and technical difficulty, the more commonly used scanning sensor is the one-way scanning sensor, which can only realize one-way measurement, and the obtained measurement data is one-dimensional scalar data of the measured feature, reflecting the actual characteristics of the measured feature The comprehensive change of the profile relative to the theoretical profile, but cannot provide the specific change of the actual profile point of the measured feature in each direction relative to the theoretical profile point, that is, the single-direction scanning sensor can only provide the change of the measured feature, but cannot provide The direction of change of the measured feature
[0004] Based on this, the unidirectional scanning sensor can only be used for the measurement of simple features with a clear direction of change, or the measurement of features that do not pay attention to the direction of change, but cannot be used for the measurement of complex features, such as free curves, free Curved surfaces, etc., which severely limit the application scenarios of unidirectional scanning sensors, and it is difficult to give full play to their advantages
Moreover, since the unidirectional scanning sensor can only provide one-dimensional scalar information about the measured feature, but cannot provide its corresponding direction information, the contour obtained according to the one-dimensional scalar information has a large deviation compared with the actual contour, which affects subsequent processing. the accuracy of

Method used

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  • Method and device for vectorizing measurement data of unidirectional scanning sensor
  • Method and device for vectorizing measurement data of unidirectional scanning sensor
  • Method and device for vectorizing measurement data of unidirectional scanning sensor

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Embodiment Construction

[0039] Due to the prior art, the unidirectional scanning sensor cannot be used for the unclear change direction or focus on the change direction.

[0043] S3, based on the measurement direction information of the actual contour point, vectorize the one-dimensional scalar information.

[0051] It can be understood that the position information of the theoretical contour point can be represented in the form of three-dimensional coordinates. theoretical contour point

[0052] Then step S2 is performed. Since the unidirectional scanning sensor is configured on the measurement carrying device, the unidirectional scanning

[0066]

[0067] wherein, is an interpolation parameter.

[0070]

[0080] Based on the result of the vectorization, the position information of the actual contour point is determined.

[0081] Specifically, in this embodiment of the present invention, after the vectorization, the result of the vectorization can also be used to determine the measurement point

[0085...

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Abstract

The invention provides a method and device for vectorizing measurement data of a unidirectional scanning sensor, which can realize vectorization of measurement data of a unidirectional scanning sensor, improve the applicability and measurement accuracy of the unidirectional scanning sensor, and solve the problems in the application of the unidirectional scanning sensor. Insufficient applicability, poor precision and other problems have promoted the application and advantages of single-directional scanning sensors in practice, and have very practical application value.

Description

Method and device for vectorizing measurement data of unidirectional scanning sensor technical field The present invention relates to measurement data processing technical field, relate in particular to a kind of unidirectional scanning sensor measurement data vector Quantification method and apparatus. Background technique [0002] In measurement technology, the distinguishing feature of scanning sensors (ie scanning sensors) compared to trigger sensors is, With strong data acquisition ability, it can acquire a large amount of data on the surface of the measured feature in a short time, which is conducive to the precision Refinement analysis; continuous data acquisition capability enables uninterrupted measurement, with significant efficiency in the measurement of continuous features Advantage. Therefore, the scanning sensor has excellent performance in refined evaluation, continuous feature measurement, and large-scale and high-density measurement scenarios. appli...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25G01B7/28
Inventor 孙艺华孔祥源张旭涛
Owner BEIJING JINGDIAO GRP CO LTD
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