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Root cause location method, device, equipment, medium and product of abnormal production

A locating method and root cause technology, applied in the field of equipment, device, abnormal root cause locating method, medium and product fields, can solve the problem of low accuracy of root cause locating, and achieve the solution of low accuracy and improve accuracy. Effect

Active Publication Date: 2022-04-26
CHENGDU UNION BIG DATA TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The main purpose of this application is to provide a method, device, equipment, medium and product for root cause location of production abnormalities, and to solve the technical problem of low accuracy of root cause location in the production process of existing products

Method used

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  • Root cause location method, device, equipment, medium and product of abnormal production
  • Root cause location method, device, equipment, medium and product of abnormal production
  • Root cause location method, device, equipment, medium and product of abnormal production

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Embodiment Construction

[0058] It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0059] The main solution of the embodiment of the present application is to provide a root cause location method, device, equipment, medium, and product for production abnormalities. The method obtains equipment history information and defect rate information of the target batch of products; wherein, the The equipment history information includes the history information of the root cause unit of the target batch of products at different levels; based on the history information of the target level in the equipment history information, a plurality of virtual parallel units along the target path are constructed; wherein, the target The path is the path of the target batch of products at the target level; the virtual parallel unit includes virtual units generated by the products in the target batch of ...

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Abstract

Embodiments of the present application provide a root cause location method, device, equipment, medium, and product for abnormal production. The method obtains equipment history information and defect rate information of the target batch of products; based on the target level in the equipment history information, history information, construct a plurality of virtual parallel units along the target path; based on the equipment history information and defect rate information of the target batch of products, obtain the defect concentration value of each virtual parallel unit; based on each of the virtual parallel units Bad concentration values ​​for cells to determine the root cause of the anomaly. This method can improve the accuracy of the location of the root cause of the defect; especially for the situation where there is less data when there is a sudden defect in the product production process, it can significantly improve the accuracy of the root cause location of the defect, and solve the problem of the location accuracy of the root cause of the product production process. Low technical issues.

Description

technical field [0001] The invention relates to the technical field of production control, in particular to a root cause location method, device, equipment, medium and product for abnormal production. Background technique [0002] The product production process (for example, panel production) generally includes multiple production links, and each production process involves a large number of complex processes, and these processes are completed by a series of equipment configured in series or in parallel. In actual production, in the face of large-scale production equipment, it becomes more difficult to carry out effective equipment control and positioning analysis that affects product quality. Especially when a sudden abnormal fault occurs, the accuracy of root cause location is low. Contents of the invention [0003] The main purpose of this application is to provide a method, device, equipment, medium and product for root cause location of production abnormalities, and ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20
CPCG06F30/20
Inventor 不公告发明人
Owner CHENGDU UNION BIG DATA TECH CO LTD
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