Terahertz frequency band noise parameter measuring system and measuring method
A technology for measuring system and noise parameters, which is applied in the microwave field and can solve problems such as large errors and low accuracy
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[0038] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
[0039] In order to illustrate the technical solutions of the present invention, specific examples are used below to illustrate.
[0040] refer to figure 1 An embodiment of the present invention provides a measurement system for noise parameters in the terahertz frequency band, including: a signal source 11 , a frequency mixing device 12 , at least five noise sources 13 , a switching device 14 and...
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