Terahertz frequency band noise parameter measuring system and measuring method

A technology for measuring system and noise parameters, which is applied in the microwave field and can solve problems such as large errors and low accuracy

Pending Publication Date: 2022-03-01
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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Problems solved by technology

[0004] In view of this, an embodiment of the present invention provides a measurement system and method for noise parameters in the terahertz frequency band, so as to solve the problem of large errors and low accuracy in the prior art that the Y factor method is used to measure noise parameters in the terahertz frequency band

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  • Terahertz frequency band noise parameter measuring system and measuring method
  • Terahertz frequency band noise parameter measuring system and measuring method
  • Terahertz frequency band noise parameter measuring system and measuring method

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Embodiment Construction

[0038] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.

[0039] In order to illustrate the technical solutions of the present invention, specific examples are used below to illustrate.

[0040] refer to figure 1 An embodiment of the present invention provides a measurement system for noise parameters in the terahertz frequency band, including: a signal source 11 , a frequency mixing device 12 , at least five noise sources 13 , a switching device 14 and...

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Abstract

The invention is suitable for the technical field of microwaves, and provides a terahertz frequency band noise parameter measuring system and method, and the system comprises a signal source, a frequency mixing device, at least five noise sources, a switching device and a noise receiver. The at least five noise sources are respectively connected with the input end of the to-be-tested piece through the switch device; wherein only one noise source is communicated with the input end of the to-be-tested piece each time; the first input end of the frequency mixing device is connected with the output end of the to-be-tested piece, the second input end of the frequency mixing device is connected with the signal source, and the output end of the frequency mixing device is connected with the noise receiver; the at least five noise sources are used for providing at least five different source impedance states for the to-be-tested piece through the switching device. According to the terahertz frequency band noise measurement system provided by the invention, five different source impedance states are provided through the at least five noise sources, system errors introduced by source impedance mismatch of the to-be-measured piece are corrected, and the accuracy of terahertz frequency band noise parameter measurement is improved.

Description

technical field [0001] The invention belongs to the field of microwave technology, and in particular relates to a measurement system and a measurement method for noise parameters in a terahertz frequency band. Background technique [0002] Terahertz waves are electromagnetic radiation between microwaves and infrared. With the development of microelectronic technology, microwave technology and optical technology, terahertz technology has gradually grown up and is widely used in the field of communication technology. The noise figure is used to describe the quality factor of the amount of noise that occurs in the system, and the noise parameters are used to provide guidance for the optimal design of the network noise figure. Accurate measurement of noise parameters plays a role in the simulation, modeling and design of semiconductor microwave monolithic integrated circuits. play an important role. [0003] In the prior art, for the terahertz band, the Y factor method is usua...

Claims

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Application Information

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IPC IPC(8): G01R29/26
CPCG01R29/26
Inventor 栾鹏王一帮吴爱华刘晨梁法国霍晔孙静陈晓华荆晓冬
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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