Device and method for measuring structural deflection
A measurement method and imaging device technology, which is applied in the field of dynamic deflection measurement, can solve the problems of high price, influence of device accuracy, and inaccurate measurement, and achieve the effect of simple structure principle, small external factors, and elimination of small inclination deformation
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Embodiment 1
[0040] This embodiment discloses a device for measuring structural deflection, in figure 1 Among them, reference numeral 1 is a laser, 2 is a hem part, 3 is a device shell, 4 is a damping system, and 6 is a suspender. The suspender 6, the laser 1, the device shell 3 and the hem part 2 form a single pendulum system. The rod 6 and the device shell 3, the laser 1 and the suspender 6 are hinged, the laser 1 and the hem part 2 are fixed at 90 degrees, and the fixed connection is a detachable threaded connection. When the single pendulum system is stable, the laser 1 can emit horizontally collimated beam.
[0041] The hem part 2 is placed in a damping system 4, which is a high-viscosity liquid or a magnetic damper, and this high-viscosity liquid can reduce the sway of its own liquid plane when the beam deflection is measured, and can also make the The simple pendulum system that bottom part 2 constitutes stops fast. The magnetic damper is composed of a conductor and a magnetic cyl...
Embodiment 2
[0108] refer to figure 1 , the image sensor used in this specific implementation case is CCD, the sampling unit of the linear array CCD scanning device is 96, the interval of each linear array unit is 1.00mm, and the peak value of each pixel unit is 1024, the single-chip microcomputer reads through AD sampling The light value of each unit, combined with the step value of the linear CCD scanning device in the X direction, draws the image of the spot in the single-chip microcomputer, and then finds the position corresponding to the maximum brightness according to the brightness of each unit, which is the position of the spot .
Embodiment 3
[0110] As another improved embodiment of the device of the present invention, it can be as figure 2 As shown, two lasers can be added to project the light spots on the left and right sides of the electronic scale to further reduce the influence of the inclination angle that may be caused by structural vibration, and eliminate the influence of the reciprocating vibration of the single pendulum system by averaging the moving distance of the electronic scale on both sides.
[0111]
[0112] In the formula: γ is the inclination angle of the laser, Δ 1 is the deflection measured by electronic scale 1, Δ 2 is the deflection measured by electronic scale 2, d 1 is the distance from the center of the electronic scale 1 to the center of the device, d 2 is the distance from the center of the electronic scale 2 to the center of the device.
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