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Solid state disk testing method and device and electronic equipment

A technology of a solid-state hard disk and a test method, applied in the storage field, can solve the problems of high test cost, increase test cost, poor test effect, etc., and achieve the effect of reducing test cost and improving test effect.

Pending Publication Date: 2022-01-18
JIANGSU XINSHENG INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method can solve the shortcomings of method 1, but it needs to purchase the motherboard separately and develop a driver for disk testing, which increases the test cost
To sum up, the existing solid-state hard drives have the problems of relatively poor test results or relatively high test costs.

Method used

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  • Solid state disk testing method and device and electronic equipment
  • Solid state disk testing method and device and electronic equipment
  • Solid state disk testing method and device and electronic equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0047] An embodiment of the present disclosure provides a testing method for a solid state disk.

[0048] In this embodiment, the SSD is connected to the motherboard, please refer to figure 1 , the testing method of the solid-state hard disk provided by the embodiment of the present disclosure includes:

[0049] Step S101, read the memory address of the control register stored in the target register of the solid state disk.

[0050]In this embodiment, the solid state hard disk may be a non-volatile (Non Volatile Memory Express, NVME) solid state hard disk or a serial port hard disk (Serial Advanced Technology Attachment, SATA) type. The configuration space of the SSD stores configuration information. After the SSD is connected to the motherboard, the configuration information of the configuration space can be read using the start_memmap function by traversing the data bus (bus), device (device), and function (function). There are 6 bar registers in the configuration space, n...

Embodiment 2

[0101] An embodiment of the present disclosure provides a testing device for a solid state disk.

[0102] Specifically, see image 3, the testing device 300 of the solid-state hard disk provided by the embodiment of the present disclosure, the solid-state hard disk is connected to the motherboard, and the testing device 300 of the solid-state hard disk includes:

[0103] A reading module 301, configured to read the memory address of the control register stored in the target register of the solid-state hard disk;

[0104] The processing module 302 is configured to apply for a first virtual address to the motherboard, and write a test operation command to the solid-state hard disk at the first virtual address;

[0105] A determining module 303, configured to determine a first physical address corresponding to the first virtual address according to the pre-configured physical page file, and write the test operation command into the first physical address according to preset prot...

Embodiment 3

[0123] In addition, an embodiment of the present disclosure provides an electronic device, including a memory and a processor, the memory stores a computer program, and when the computer program runs on the processor, it executes the solid-state hard disk provided in Embodiment 1 above. testing method.

[0124] It should be understood that the electronic device provided in this embodiment can implement the solid-state disk testing method provided in Embodiment 1. For related descriptions, please refer to the content of Embodiment 1. To avoid repetition, details are not repeated here.

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Abstract

The embodiment of the invention provides a solid state disk testing method and device and electronic equipment. The method comprises the following steps: reading a memory address of a control register stored in a target register of a solid state disk ; applying a first virtual address to the mainboard, andwriting a test operation command for the solid state disk in the first virtual address; determining a first physical address corresponding to the first virtual address according to the pre-configured physical page document, and writing the test operation command into the first physical address according to a preset protocol rule; writing the first physical address into a memory address of a control register; and executing the test operation command through the control register to obtain a test command execution result. Therefore, the use of a packaged ioctl function is avoided, the linux application layer can send the test operation command to the solid state disk, the test effect of the solid state disk is improved, and the test cost of the solid state disk is reduced.

Description

technical field [0001] The present application relates to the field of storage technology, and in particular to a testing method, device and electronic equipment of a solid-state hard disk. Background technique [0002] The existing Solid State Drive (SSD) needs to follow the protocol to send commands during the working process, and the test of the SSD must cover the protocol test scenario. At present, protocol testing is basically performed at the linux application layer. There are two common testing methods: the first testing method is to use the ioctl function encapsulated by SSD to send commands for testing, such as smartctl, haparm and other tools. This method is the simplest The quickest and most common way to test. But there are many features in this test method that are modified or blocked by the kernel. The second test method is to develop a driver to replace the driver packaged in the linux application layer. This method can solve the shortcomings of method 1, b...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/18G11C29/38
CPCG11C29/18G11C29/38
Inventor 徐凤琴
Owner JIANGSU XINSHENG INTELLIGENT TECH CO LTD
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