Electronic probe analysis method for testing trace elements Na, K, P, S and Ni of lunar glass beads

Abstract

The invention relates to an electronic probe analysis method for testing trace elements Na, K, P, S and Ni of lunar glass beads. The method comprises the following steps of: preparing a sample; selecting a proper glass standard sample; determining characteristic X-rays for testing Na, K, P, S and Ni elements; determining test voltage; determining current and beam spot conditions; determining an analysis spectrometer and a crystal; determining peak position test time of each element; determining characteristic X-ray peak positions and backgrounds of the Na, K, P and Ni elements in the glass standard sample; determining the peak position and background of the S element in the glass standard sample; correcting an overlapping peak; testing the components of the glass standard sample; and testing the components of a moon glass bead to be tested. The trace elements in the lunar glass are analyzed by optimizing the electronic probe analysis method, the accuracy (reproducibility) is high, the content change of the trace elements is within + / -10%, and the damage to the lunar glass beads caused by an electronic probe is effectively reduced.

Description

technical field [0001] The invention relates to the field of lunar glass bead sample monitoring, in particular to an electronic probe analysis method for testing lunar glass bead trace elements Na, K, P, S and Ni. Background technique [0002] Lunar glass beads are an important part of lunar soil and rocks, and their trace elements Na, K, P, S, and Ni (less than 100ppm) are important for distinguishing the types of lunar glass beads, revealing the evolution history of the mantle and crust, and reflecting It is of great significance to interpret the origin of moon rocks. Accurate determination of the content of these elements is the key to studying scientific issues such as the evolution of the moon. [0003] Currently, minerals / glasses can be tested for trace elements using secondary ion mass spectrometry (SIMS), laser ablation plasma mass spectrometry (LA-ICP-MS) and electron probe (EPMA). Although SIMS and LA-ICP-MS can provide lower element detection limits, both SIMS a...

AI Technical Summary

Problems solved by technology

[0005] Existing technology can use high beam current and long time conditions to obtain trace elements of some minerals (such as Ti and Al of quartz), but high beam current and long time analysis conditions are not suitable for glass, because glass has no fixed crystal structure, Unable to withstand the bombardment of electron beams under such conditions, it is easy to be burned by electron beams

Moreover, the current electronic probe technology still has the following problems for the analysis of trace elements: (1) when the element content is 100 ppm or below, the accuracy and precision of the test data need to be improved; (2) due to the lack of matching standard samples , the accuracy and precision of the test data cannot be evaluated; (3) prolonging the analysis time can reduce the detection limit, but it leads to a decrease in the analysis efficiency, and the two cannot be balanced; (4) improper operating conditions have a negative impact on the precious lunar glass bead samples damage

Therefore, on the one hand, the traditional electron probe analysis method cannot meet the accuracy and quantitative measurement of trace elements. On the other hand, based on the preciousness and fragility of lunar samples, it is necessary to develop a completely non-destructive, high-precision lunar glass sample. The analysis method of trace Na, K, P, S and Ni in glass beads is of great significance for the study of the origin of lunar rocks and the evolution of the moon.

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