Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Field-of-view-expanded spatial heterodyne interferometer optical system for Raman spectrum detection

A space heterodyne and optical system technology, applied in the field of spectral detection, to achieve the effect of increasing the field of view, high time resolution, and small volume

Pending Publication Date: 2021-11-23
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the technical problems that existing Raman spectrometers require smaller slits to obtain higher spectral resolution, and the design of small slits limits the amount of light entering the spectrometer, system detection sensitivity and spectral range, the present invention provides a Optical System of Extended Field Spatial Heterodyne Interferometer for Raman Spectroscopy

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Field-of-view-expanded spatial heterodyne interferometer optical system for Raman spectrum detection
  • Field-of-view-expanded spatial heterodyne interferometer optical system for Raman spectrum detection
  • Field-of-view-expanded spatial heterodyne interferometer optical system for Raman spectrum detection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0053] In order to make the purpose, advantages and features of the present invention clearer, the optical system of the expanded field of view spatial heterodyne interferometer for Raman spectrum detection proposed by the present invention will be further described in detail below in conjunction with the accompanying drawings and specific implementation examples.

[0054] This implementation provides an optical system of an expanded field of view spatial heterodyne Raman interferometer to realize the detection of the Raman spectral signal of the 532nm excitation light source, such as figure 1As shown, the optical system includes a front collimator lens 1, a spatial heterodyne interferometer 2, a fringe imaging lens 3 and a photodetector 4; the wavefront of the target to be measured is collimated by the front collimator lens 1 and transmitted to space The heterodyne interferometer 2, through the spatial heterodyne interferometer 2, generates a series of interferograms on the lo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
wavelengthaaaaaaaaaa
wavelengthaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention provides a field-of-view-expanded spatial heterodyne interferometer optical system for Raman spectrum detection, and solves the problem that the small slit design of an existing Raman spectrometer limits the amount of light entering the spectrometer, the detection sensitivity and the spectral range. The system comprises a front collimating lens, a spatial heterodyne interferometer, a stripe imaging lens and a photoelectric detector which are sequentially arranged along a light path; the front collimating lens transmits incident exciting light to the spatial heterodyne interferometer in a parallel light form; the spatial heterodyne stem instrument enables parallel light to form an interference pattern at a localization plane, the fringe imaging lens enables the interference pattern to be imaged on the photoelectric detector, and the spatial heterodyne stem instrument comprises an optical filter, a beam splitter, a first view field broadening prism, a second view field broadening prism, a first grating and a second grating; the beam splitter is arranged on an emergent light path of the front collimating lens; and the first grating and the first view field broadening prism form a first optical unit, and the second grating and the second view field broadening prism form a second optical unit which are located in two emergent light paths of the beam splitter respectively.

Description

technical field [0001] The invention relates to spectrum detection technology, in particular to an optical system of an expanded field of view spatial heterodyne interferometer for Raman spectrum detection. Background technique [0002] Raman spectroscopy technology is a spectral inspection technology based on the Raman effect. It uses laser light to irradiate the sample to be tested, collects and analyzes the Raman scattered light generated by the sample, and realizes qualitative analysis and theoretical measurement of the sample. It is accurate, non-destructive and efficient. , obvious characteristic peaks, good reproducibility and no need for sample preparation. [0003] Currently commonly used Raman spectrometers mostly use grating spectrometers without moving parts. Such spectrometers require smaller slits for higher spectral resolution, and such small slit designs will limit the amount of light entering the spectrometer, limit the detection sensitivity of the system, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/65G01N21/01
Inventor 赵珩翔冯玉涛李娟孙剑傅頔畅晨光吴阳周冠孙晨范博昭
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products