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Semiconductor process equipment and mixed gas inlet device thereof

A technology of mixed air intake and process equipment, which is applied in semiconductor/solid-state device manufacturing, metal material coating process, electrical components, etc. problems, to achieve the effect of increasing production capacity, improving mixing uniformity, and improving film uniformity

Active Publication Date: 2021-09-24
BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of the shortcomings of the existing methods, the present application proposes a semiconductor process equipment and its mixed gas inlet device to solve the problems of low process gas mixing efficiency and poor uniformity of wafer film formation caused by low gas mixing efficiency in the prior art technical issues

Method used

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  • Semiconductor process equipment and mixed gas inlet device thereof
  • Semiconductor process equipment and mixed gas inlet device thereof
  • Semiconductor process equipment and mixed gas inlet device thereof

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Embodiment Construction

[0027] The present application is described in detail below, and examples of embodiments of the present application are shown in the drawings, wherein the same or similar reference numerals denote the same or similar components or components having the same or similar functions throughout. Also, detailed descriptions of known technologies will be omitted if they are not necessary to illustrate the features of the present application. The embodiments described below by referring to the figures are exemplary only for explaining the present application, and are not construed as limiting the present application.

[0028] Those skilled in the art can understand that, unless otherwise defined, all terms (including technical terms and scientific terms) used herein have the same meanings as commonly understood by those of ordinary skill in the art to which this application belongs. It should also be understood that terms, such as those defined in commonly used dictionaries, should be ...

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Abstract

The embodiment of the invention provides semiconductor process equipment and a mixed gas inlet device thereof. The mixed gas inlet device comprises a mixed gas inlet block and a cover body assembly; a first annular cavity and multiple gas inlet channels are formed in the mixed gas inlet block, the top of the first annular cavity communicates with the multiple gas inlet channels, and the bottom of the first annular cavity communicates with a gas mixing channel in the cover body assembly; the multiple gas inlet channels extend in the tangential direction of the first annular cavity, and gas outlets of the multiple gas inlet channels are evenly distributed in the circumferential direction of the first annular cavity; and the mixed gas inlet block is arranged in the middle of the top of the cover body assembly, the bottom of the cover body assembly covers the top of a process chamber, and the gas mixing channel is formed in the cover body assembly and used for re-mixing process gas in the mixed gas inlet block and inputting the process gas into the process chamber after uniform flow. According to the embodiment of the invention, the concentration distribution of the process gas is effectively improved before the process gas reaches the surface of a wafer so that the film forming uniformity of the wafer can be greatly improved while the process time is effectively shortened.

Description

technical field [0001] The present application relates to the technical field of semiconductor processing, and in particular, the present application relates to a semiconductor process equipment and a mixed air intake device thereof. Background technique [0002] At present, the atomic layer deposition (Atomic layer deposition, ALD) process is a relatively advanced thin film deposition process. As the line width reaches 7nm and 5nm, the use of ALD to deposit thin films will become more and more widely used, such as Al 2 o 3 , HfO, HfZrO, TaN, TiN, TaO and W thin films can be applied to most integrated circuit (IC) fields, such as logic devices, dynamic random access memory (DRAM), 3D flash memory, etc. The advantages of the ALD process are self-limited periodic growth, excellent film quality, and excellent step coverage, but the low growth rate and long process time will greatly affect the productivity of the equipment. [0003] In the current mainstream ALD process equipm...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C16/455H01L21/67
CPCC23C16/45544H01L21/67017C23C16/455C23C16/45561C23C16/45512H01L21/0228
Inventor 魏景峰郑波朱磊纪红赵可可
Owner BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
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