A metering device for irregular surfaces or contours with adjustable precision

Abstract

The application provides a metering device with adjustable precision for irregular surfaces or contours, which includes a housing and an electric heating wire. The inside of the housing is fitted with a clamping assembly, and an adjustment assembly is arranged above the housing. The adjustment assembly The front end of the housing is provided with a transmission assembly; the rear end of the housing is provided with a calibration assembly, the front end of the calibration assembly is provided with a pressing assembly, and the front end of the pressing assembly is connected with a contour fitting assembly; the housing includes a top shell, a bottom shell, a fixed shaft , a movable plate, a card slot, an inner groove and a limiting plate; a bottom case is movably installed below the top case, and fixed shafts are fixedly connected to the left and right sides of the top case and the bottom case. The present application improves on the existing basis, and through the linkage structure among the adjustment assembly, the transmission assembly, the pressing assembly and the contour fitting assembly, the device can adapt to objects of different sizes for more comprehensive contour sampling, and The overall shape of the profile can be displayed in time after sampling.

Description

Technical field [0001] The present invention relates to the field of contour sampling, and in particular, to a metering device that is an irregular surface or contour. Background technique [0002] A surface contour detection device and detection method proposed in China inventions: CN200610032807.9, including steps: providing first sensors, second sensors, and CNC systems; providing workpieces to be detected, the workpiece to be detected has first Detect surface and second detection surface; align the first sensor to the first detecting surface, so that the central axis of the first sensor is greater than 45 ° along the elongation line of the extension line of the first detecting surface, and will The second sensor aligned the second detection surface, so that the central axis of the second sensor is greater than 45 ° along the extension line of the probe direction and the cut surface of the second detecting surface; the first sensor and the first sensor are set by the CNC syste...

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is: the current existing contour sampling device cannot simultaneously sample multiple positions of the object, the use effect is poor, and in the process of use, the device cannot be detected according to the size of the object The problem of adjusting the accuracy and detection range

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