Nonlinear micro-current acquisition device and method suitable for Langmuir probe
A technology of Langmuir probe and acquisition device, which is applied in the field of nonlinear microcurrent acquisition device, can solve the problems of large surface area, inapplicability, and large acquisition current of the probe, and achieves improved signal-to-noise ratio, low working power consumption, The effect of high-precision acquisition
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Embodiment 1
[0048] This embodiment provides a nonlinear microcurrent collection device suitable for Langmuir probes;
[0049] Such as Figure 9 As shown, the nonlinear microcurrent acquisition device suitable for Langmuir probes includes:
[0050] Several parallel Langmuir probes;
[0051] The first end of each Langmuir probe is disposed in the plasma of the ionosphere;
[0052] The second end of each Langmuir probe is connected with a nonlinear acquisition amplifier circuit;
[0053] The nonlinear acquisition and amplification circuit is also connected to the output end of the scanning voltage loading circuit; the input end of the scanning voltage loading circuit is also connected to the Microcontroller Unit (MCU);
[0054] The nonlinear acquisition amplifier circuit is also connected with the input end of the low-pass filter circuit;
[0055] The output terminal of the low-pass filter circuit is connected with the micro control unit MCU;
[0056] The micro control unit MCU is conne...
Embodiment 2
[0174] This embodiment provides a nonlinear microcurrent acquisition method suitable for Langmuir probes;
[0175] Nonlinear microcurrent acquisition methods for Langmuir probes, including:
[0176] The micro control unit MCU outputs a small-scale scanning voltage through a built-in DA module; the small-amplitude scanning voltage is 0-3.3V;
[0177] After the scanning voltage of small amplitude is processed by the scanning voltage loading circuit, it becomes a scanning voltage of -10V ~ 10V; the scanning voltage of -10V ~ 10V is applied to the Langmuir probe;
[0178] The potential on the Langmuir probe attracts charged particles to hit the surface of the Langmuir probe. The impact of charged particles causes the potential of the Langmuir probe to be uneven, causing current to flow, and the magnitude and direction of the current on the Langmuir probe respond The physical properties of the plasma;
[0179] The nonlinear acquisition and amplification circuit collects the curre...
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