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Black surface object depth image measuring method based on binocular structured light

A technology of depth image and measurement method, which is applied in the field of 3D structured light measurement, can solve the problems of measurement data loss, measurement blind area, etc., and achieve the effect of less repetitive calculation, small calculation amount and accurate measurement

Active Publication Date: 2021-04-30
INST OF INTELLIGENT MFG GUANGDONG ACAD OF SCI
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Problems solved by technology

[0004] In order to overcome the problems existing in related technologies, the present invention provides a method for measuring the depth image of black surface objects based on binocular structured light, so as to solve the problem of black absorbing light, possible The measurement data will be lost during the measurement, resulting in the defect of measurement blind area

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  • Black surface object depth image measuring method based on binocular structured light
  • Black surface object depth image measuring method based on binocular structured light
  • Black surface object depth image measuring method based on binocular structured light

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Embodiment Construction

[0077] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention.

[0078] In some processes described in the specification and claims of the present invention and the above-mentioned drawings, a plurality of operations appearing in a specific order are contained, but it should be clearly understood that these operations may not be performed in the order in which they appear herein Execution or parallel execution, the serial numbers of the operations, such as 101, 102, etc., are only used to distinguish different operations, and the serial numbers themselves do not represent any execution order. Additionally, these processes can include more or fewer operations, and these operations can be performed sequentially or in parallel. It should be n...

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Abstract

The invention relates to a black surface object depth image measuring method based on binocular structured light. According to the scheme, the method comprises the steps of adjusting black surface object image acquisition equipment and a black surface object to an initial state; adjusting the black surface object image acquisition device and the black surface object from the initial state to an exposure state; shooting to obtain a color image; obtaining a gray average value and a standard deviation of a black object according to the color picture, and obtaining a first depth image and a second depth image by using a depth fusion method and a plurality of depth image fusion algorithms; and obtaining a black surface object target depth image through an image fusion algorithm. According to the scheme, the problems that the size of a black surface object cannot be accurately measured and point cloud data is easy to lose during measurement in the existing 3D measurement technology are solved through multi-exposure, aperture and power adjustment of multi-view structured light and multi-graph data fusion, and the method has the advantages of simplicity in operation, high efficiency and high universality.

Description

technical field [0001] The invention relates to the technical field of 3D structured light measurement, in particular to a method for measuring depth images of black surface objects based on binocular structured light. Background technique [0002] The rapid development of computer vision technology is increasingly affecting and even changing people's lives, and is widely used in industry and manufacturing. As an important branch in the field of computer vision, 3D visual imaging and detection has been applied in many fields in recent years because of its high efficiency, high precision and ability to meet various application requirements of automated production lines. As an important branch of three-dimensional vision technology, 3D structured light measurement technology uses a projection device to project a structured light pattern with encoded information on the measured object, and the camera records the structured light pattern information to decode and restore the thr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C11/02G01C11/30
CPCG01C11/02G01C11/30
Inventor 徐晨刘伟鑫周松斌
Owner INST OF INTELLIGENT MFG GUANGDONG ACAD OF SCI
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