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A multi-parameter measurement probe and measurement method for in-orbit tiny space debris

A technology of tiny space and measuring probe, applied in measuring devices, instruments, etc., can solve the problems of complex design, inability to measure speed, large volume power consumption, etc., and achieve the effect of easy integrated installation, simple structure and light weight

Active Publication Date: 2022-07-05
BEIJING INST OF SPACECRAFT SYST ENG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical principle of the space debris plasma detector is: when the space debris hits the detector target at high speed, a large amount of plasma is generated, the electrons and ions in the plasma are separated by the electric field, and the electron or ion current is measured to obtain the space debris velocity. The "Dust Detector (DDS)" detector with advanced technology was carried on the Galileo satellite and the Ulysses satellite in 1987 and 1990 respectively, and the GORID plasma detector was carried on the Russian EXPRESS-2 satellite. large, complex design
[0006] The above measurement methods use electronic circuits (active) to obtain measurement data and information on orbit; while passive measurement methods are used on recyclable spacecraft, Chinese patent (CN201010522728.2) discloses a passive (circuit-free) measurement The way is to use the thin film exposed in space to capture tiny debris, then transport the detection film back to the ground, and use physical analysis methods to analyze the injection depth of tiny debris and the chemical composition of the debris. This method cannot measure the information of tiny space debris in real time, and cannot measure speed

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  • A multi-parameter measurement probe and measurement method for in-orbit tiny space debris
  • A multi-parameter measurement probe and measurement method for in-orbit tiny space debris
  • A multi-parameter measurement probe and measurement method for in-orbit tiny space debris

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Embodiment 1

[0067] The invention proposes a multi-parameter tiny space debris measurement probe. The probe structure is shown in figure 2 As shown, including front film 1, rear film 2 placed in parallel, 20 front collector electrodes 3, 20 rear collector electrodes 4, 20 front collector electrode charge amplifiers 5, 20 rear collector electrode charge amplifiers 6, front film impact Trigger 7 , high frequency pulse counter 8 , front collecting electrode charge signal summing amplifier 9 , rear collecting electrode charge signal summing amplifier 10 , rear film impact trigger 11 .

[0068] In this embodiment, the front film 1 and the rear film 2 of the probe are made of aluminized polyimide film as the impact carrier, and the high-speed space microscopic debris hits the front film 1 and the rear film 2 to generate plasma, and the ions in the plasma are in the collecting electrode and the collector electrode. Under the action of the electric field between the films, ions are collected and a...

Embodiment 2

[0127] The front film 1 and the back film 2 are aluminized polyimide films. The thickness refers to the data in Table 1, and the film thickness is 10 μm; p is the depth of the impact crater on the target (cm), d p is the diameter of incident tiny space debris (cm), B H is the Brinell hardness of the film material; ρ p is the density of the film material (g / cm 3 ); ρ t is the density of tiny space debris (g / cm 3 ); V n is the incident velocity relative to the film (km / s); C is the sound velocity of the material taking 5.1km / s, and the incident direction θ is 0. The thickness of the film is 20 μm, and the impact crater depth of the tiny debris should be greater than 2 times the thickness of the film (40 μm). The corresponding minimum measurable space debris range is shown in Table 1 below.

[0128] Table 1 The impact crater depth of tiny space debris in polyimide (space debris of aluminum and iron materials, θ is 0)

[0129]

[0130] Iron tiny space debris with a diamet...

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Abstract

The invention relates to a multi-parameter measurement probe and a measurement method for on-orbit tiny space debris, belonging to the field of space debris monitoring and measurement, and relates to a method for measuring multiple parameters of size, velocity and mass of on-orbit passive tiny debris, which is used for spacecraft In-orbit space debris measurement payload. The invention includes front and rear thin film sensors, front and rear charge collection electrodes, charge measurement amplifiers and high frequency pulse counters. The front and rear films are plated with metal films, and there are equal-spaced charge collection wires behind the front film and in front of the back film. A negative DC voltage is applied between the collection electrode and the film to collect the charge signals generated by the impact of tiny fragments on the front and rear films. The charges generated by the front and rear films are collected by the collecting electrodes, and amplified into voltage pulse signals by the charge amplifier. The high-frequency pulse counter measures the time difference between the impact signals on the front and rear films to obtain speed and direction information. The energy of the impact debris is obtained from the charge signal, and the mass of the space debris can be obtained by combining the velocity.

Description

technical field [0001] The invention belongs to the field of space debris monitoring and measurement, and relates to a multi-parameter measurement probe and a measurement method for on-orbit tiny space debris. Space debris measurement payload. Background technique [0002] At present, more and more space debris threatens more and more spacecraft in orbit. The research on space debris has received great attention from related fields at home and abroad. A large number of ground-based optical and radio observation equipment established at home and abroad can observe space debris with a size above centimeter level, which is the measurement of tiny space debris (sub-millimeter level and below, "Space Debris" China Aerospace Press, Duheng et al.), special on-orbit measurement equipment needs to be installed on the spacecraft. At present, the on-orbit micro space debris measurement equipment at home and abroad is based on the following technologies, which are generally single-para...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D21/02
CPCG01D21/02
Inventor 向宏文郝志华李衍孙华亮蔡震波张志平戴孟瑜秦珊珊闫军李怀锋
Owner BEIJING INST OF SPACECRAFT SYST ENG
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