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Microwave electric field intensity measuring method and device

A measurement method and technology of electric field strength, applied in the field of microwave electric field strength measurement methods and devices, capable of solving problems such as limited detection of light transparent windows in microwave electric field strength measurement schemes

Pending Publication Date: 2020-12-18
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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Problems solved by technology

[0003] Among them, the microwave electric field intensity measurement scheme based on the quantum EIT-AT effect is limited by the width of the detection light transparent window, and the width of the detection light window is affected by factors such as laser line width, photon shot noise, and Rydberg atom decoherence. It is difficult to achieve precise measurement of extremely weak microwave electric fields

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Embodiment Construction

[0025] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the implementation manners in the present invention, all other implementation manners obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of the present invention.

[0026] Such as figure 1 As shown, the invention provides a kind of measuring method of microwave electric field strength, comprises the following steps:

[0027] S11: setting the atom in the Rydberg state at a position that can sense the local microwave electric field and the microwave electric field of the signal to be measured;

[0028] S12: Using a detector to receive a detection signal of a set frequency band or frequ...

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Abstract

The invention provides a microwave electric field intensity measurement method and device. The method comprises the steps: setting an atom in a Rydberg state at a position where a local microwave electric field and a to-be-measured signal microwave electric field can be sensed, and then receiving a detection signal of a set frequency band or frequency after the atom is irradiated by detection light through a detector, and further determining the phase of the signal microwave electric field according to the detection signal. The measurement method is based on the quantum superheterodyne principle, the principle is clear and implementation and application are easy; Rydberg atoms are used as a microwave sensitive medium, so that high-sensitivity measurement of the microwave electric field intensity is achieved. The method not only can significantly improve the measurement sensitivity of the microwave electric field intensity, but also achieves the purposes of breaking through existing indexes and improving the measurement precision of the microwave electric field by one order of magnitude, thereby providing a new technical basis for the precision measurement research of the microwaveelectric field intensity.

Description

technical field [0001] The invention relates to the field of microwave electric field strength measurement, and more specifically, to a method and device for measuring microwave electric field strength. Background technique [0002] High-sensitivity measurement of microwave electric field strength plays an important role in astronomy, communication, radar and other fields. At present, the microwave electric field strength is usually measured by traditional sensor equipment such as antennas and electric field probes, and its detection sensitivity is about 1V / m. In recent years, with the development of quantum technology, attempts have been made internationally to use quantum technology to achieve high-sensitivity measurement methods for microwave electric field strength. [0003] Among them, the microwave electric field intensity measurement scheme based on the quantum EIT-AT effect is limited by the width of the detection light transparent window, and the width of the detec...

Claims

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Application Information

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IPC IPC(8): G01R29/12
CPCG01R29/12
Inventor 成永杰靳刚黄承祖刘星汛齐万泉
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT
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