In-band OSNR measuring device and method based on fine spectrum

Abstract

The invention discloses an in-band OSNR measuring device and method based on a fine spectrum. The device comprises a to-be-measured light input module, a polarization modulation module, a fine spectrum measuring module and a processing and analyzing module. The to-be-measured light input module regulates and controls the power of the to-be-measured signal light, so that the power level of the to-be-measured signal light meets subsequent processing requirements; the polarization modulation module performs polarization processing on the signal light to be measured so as to eliminate the influence of the polarization effect of the signal light to be measured on the in-band OSNR measurement precision; the fine spectral measuring module sequentially acquires fine spectral information of pm resolution of the optical transmission signal component and the noise component which are separated by the polarization modulation module; the processing and analysis module supports the adoption of a polarization zeroing method, a differential spectral response method, a differential spectral resolution bandwidth identification method, a noise fitting method and other in-band OSNR inversion algorithms, and achieves the high-precision measurement of the in-band OSNR of a high-speed optical transmission system.

Description

technical field [0001] The invention relates to the field of spectrum detection, in particular to an in-band OSNR measurement device and method based on fine spectrum. Background technique [0002] Spectral analysis is a key diagnostic tool in optical applications such as communications, sensing, molecular spectrometers, and microwave generation. For example, optical methods are used to measure spectral parameters of ultra-high-speed signals transmitted in optical fiber communication systems, and the signal quality of transmitted signals can be obtained. , OSNR, bit error rate and other information are an effective means of diagnosing and monitoring transmission signals. In particular, OSNR, or Optical Signal-to-Noise Ratio, as one of the most useful parameters for estimating signal quality directly in the optical link layer, has drawn great attention from the industry. OSNR has long been considered as a key performance indicator of dense wavelength division multiplexing sy...

AI Technical Summary

Problems solved by technology

[0008]Therefore, the existing in-band OSNR measurement device using a spectrum analyzer is limited by the spectral resolution and no The limitation of indicators such as spurious dynamic range, based on the principle of polarization difference, there is an obvious depolarization effect introduced by polarization mode dispersion, and the maximum spectral resolution limit of 20pm, resulting in the measured in-band OSNR, due to too large a deviation Little use, especially for new generation high bit rate signals carried over narrow DWDM channels

In addition, to obtain accurate measurement results, it is necessary to find the real minimum value of the measured power of each channel, this constraint will greatly increase the measurement time

Therefore, with the development of high-speed optical transmission technology and the deployment of high-speed optical networks, the existing in-band OSNR measurement devices and solutions based on traditional optical spectrum analyzers are limited by spectral resolution, and it is difficult to achieve the pm resolution of optical signals. The high-precision measurement of in-band OSNR parameters has been difficult to meet the application requirements

Images