Non-invasive automatic test system for subway signal system test software
A technology for automated testing and testing software, which is applied in software testing/debugging, computer components, error detection/correction, etc., and can solve the problem of limited testing accuracy, the accuracy of testers' judgment, the variety and complexity of subway signal system testing requirements, and the The performance of the test system cannot be fully utilized and other issues, resulting in high site change costs, high version switching costs, and high testing labor costs
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
[0035] Such as figure 1 Shown, the present invention is a kind of non-intrusive automatic test system for subway signaling system test software based on OCR image processing technology, comprising OCR image processing module 1, image data acquisition module 2, test script configuration module 3, client internal Inter-network communication module 4, log processing module 5, and test result visualization module 6. The OCR image processing module 1 of the pr...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com