Pressure cavity structure for comprehensive dielectric property measurement under high pressure and measurement method thereof
A technology of dielectric properties and pressure chambers, which is applied to the pressure chamber structure and its measurement field for comprehensive dielectric property measurement under high pressure, can solve inconvenience and other problems, achieve the effects of not being easily damaged, reducing the difficulty of measurement operation, and simple production
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0038] Such as figure 1 with figure 2 As shown, this embodiment provides a pressure chamber structure and measurement method for measuring the comprehensive dielectric properties of insulating materials under high pressure, and is used for measuring the comprehensive dielectric properties of insulating materials. The comprehensive dielectric property measurement includes but not It is limited to the measurement of parameters such as dielectric constant / dielectric loss / resistivity / breakdown voltage / space charge.
[0039] The structure of the pressure chamber of this embodiment, its assembly method and measurement method will be described in detail below.
[0040] 1. Pressure chamber structure
[0041] The pressure chamber structure includes a ceramic ring 1, a mold steel sleeve 2, a basalt fiber sleeve 3, a protective top cover 4, an anti-expansion protective steel sleeve 5, a low pressure hole 6, a high pressure hole 7 and a protective bottom sleeve 8. The ceramic ring 1 c...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com