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Quantitative characterization method for rapidly determining organic matter pores based on scanning electron microscope and application thereof

A scanning electron microscope, quantitative characterization technology, used in measurement devices, permeability/surface area analysis, suspension and porous material analysis, etc., can solve the problems of difficult organic pores, waste of time, small observation field, etc. High quality, simple sample preparation method, and strong image three-dimensional effect

Active Publication Date: 2020-05-29
成都悟石科技有限公司
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  • Description
  • Claims
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Problems solved by technology

In general, nanoscale organic pores need to be observed tens of thousands of times under the field of view, and repeated selection of the field of view will take a long time and waste time.
[0005] ②Case 2: Zoom in on the organic matter. When the organic matter is found under the 6000X field of view, zoom in on the organic matter, but under the 120000X field of view, it is found that the organic pores are not developed, which is not conducive to the effective observation of the morphological characteristics of the organic matter. Repeated selection of viewsheds, time-consuming and other issues
[0008] To sum up, the problems existing in the existing technology are: the scanning electron microscopy traditional imaging analysis technology of the micropores of shale reservoirs currently exists when using the scanning electron microscope to observe the organic matter pores. The field is small, it is difficult to find organic pores, and the problems such as lack of development and long observation time reduce the efficiency of experiments and scientific research
[0009] Difficulty in solving the above technical problems: at the current stage, the use of field emission scanning electron microscopy to observe organic pores needs to be observed under a field of view magnified tens of thousands of times, and it is difficult to find organic pores with a magnified field of view. Duration and other issues

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  • Quantitative characterization method for rapidly determining organic matter pores based on scanning electron microscope and application thereof
  • Quantitative characterization method for rapidly determining organic matter pores based on scanning electron microscope and application thereof
  • Quantitative characterization method for rapidly determining organic matter pores based on scanning electron microscope and application thereof

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Embodiment Construction

[0027] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0028] Aiming at the problems existing in the prior art, the present invention provides a quantitative characterization method and application for quickly determining organic matter pores based on scanning electron microscopy. The present invention will be described in detail below with reference to the accompanying drawings.

[0029] Such as figure 1 As shown, the quantitative characterization method for quickly determining the pores of organic matter based on the scanning electron microscope provided by the embodiment of the present invention includes the following steps:

[0030] S101: Using a scanning electron microsco...

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Abstract

The invention belongs to the technical field of organic matter pore identification and discloses a quantitative characterization method for rapidly determining organic matter pores based on a scanningelectron microscope and an application thereof. The method comprises steps of determining the organic matter distribution position by using a scanning electron microscope; determining the type of themicrocomponents by using an energy dispersive spectrometer and an organic matter form; determining organic pores by utilizing the organic matter microcomponents, and determining the organic matter distribution position, determining the microcomponent type, and determining the organic pore development condition. The method is advantaged in that by adopting the scanning electron microscope to identify the organic matter microcomponents, problems of small observation vision field, high difficulty in finding organic holes, no development and long observation time when the scanning electron microscope is used for observing organic matter pores at present can be effectively solved, and experiment and scientific research efficiency is reduced; the scanning electron microscope =has advantages ofhigh magnification times, strong image stereoscopic impression and simple sample preparation method, the relationship between the organic matter pores and the microcomponents is established, an enrichment mode and morphological characteristics of each microcomponent and the contact relationship between each microcomponent and minerals can be directly observed, and the organic matter pores can be identified.

Description

technical field [0001] The invention belongs to the technical field of organic matter pore identification, and in particular relates to a quantitative characterization method and application for quickly determining organic matter pores based on a scanning electron microscope. Background technique [0002] At present, the closest existing technology: at the current stage, the exploration and development of shale gas is of great significance to changing my country's resource structure and improving energy shortages and other issues. A large number of micro-nano pores are developed in shale gas reservoirs, and their structural characteristics are important indicators for measuring and evaluating shale gas reservoirs. Organic pores are closely related to the physical properties of shale reservoirs. The identification of organic pores can preliminarily judge the physical properties of shale reservoirs, which has guiding significance for the exploration and development of shale ga...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/2251G01N23/2202G01N15/08
CPCG01N15/088G01N23/2202G01N23/2251
Inventor 陈文玲邓虎成夏宇周文易婷张烨毓
Owner 成都悟石科技有限公司
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