Circuit with aging detection and PUF functions

Abstract

The invention discloses a circuit with aging detection and PUF functions. The circuit comprises a control drive circuit and 128 functional unit circuits. Each functional unit circuit comprises a firstVCO array, a second VCO array, a first shaping circuit, a second shaping circuit, a first level conversion circuit, a second level conversion circuit, a function control module, a first counter, a second counter, an arbiter, a phase comparator and a detection window. The aging detection circuit is advantageous in that the aging detection function and the PUF function are integrated, the aging detection function and the PUF circuit function can be achieved, the integration degree of a chip can be improved when the aging detection circuit is applied to the chip, and the area of the chip is reduced.

Description

technical field [0001] The invention relates to a PUF circuit, in particular to a circuit with both aging detection and PUF functions. Background technique [0002] Facing the Internet of Things era, integrated circuit development must provide compact, low-cost, and reliable edge devices with various functions, such as sensing, computing, communication, and security. This challenge has driven the integration of more and more components and functional blocks into microprocessor-based SoCs to shrink the system footprint and associated costs. However, this integration typically incurs an increased area overhead because most analog, mixed-signal, and digital circuits require extensive hardware for fast, accurate, and robust operation. [0003] The physical unclonable function circuit (The physical unclonable function, PUF) utilizes the random process deviation in integrated circuit manufacturing to generate a unique, random and unclonable random response sequence through a spec...

AI Technical Summary

Problems solved by technology

However, dedicated circuits implemented for these functions require a large area overhead, especially when they are required to have high precision and robustness

Through the research, it is found that the aging sensor and the PUF circuit exhibit a low duty cycle. The aging sensor intermittently detects the aging condition of the circuit after the life of the chip, and the PUF circuit will only work when requested (such as encrypting and decrypting messages and chip authentication processes). These make dedicated hardware further inefficient in area

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