Three-dimensional point cloud outlier elimination method based on image segmentation
A 3D point cloud and image segmentation technology, applied in image analysis, 3D image processing, image enhancement and other directions, can solve problems such as large amount of calculation, a large number of manual interactions, application-dependent scenarios, etc., to solve the lack of semantics, reduce Computational amount, more realized effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0028] see figure 1 and Figure 8 , the method for removing outliers in the 3D point cloud based on image segmentation in the present embodiment comprises the following steps:
[0029] S1, the projection direction is generated by uniform sampling in the unit sphere parameter space. The spherical parameter equation used in the present invention is as follows:
[0030]
[0031] figure 2 (a) is a schematic diagram of spherical parameter coordinates used in the present invention, wherein θ is the clockwise angle between the positive direction of the X axis and the direction of the data point position vector, and It is the angle formed by the negative direction of the Z axis and the position vector of the data point. figure 2 (b) In order to select the sampling interval as Δθ=π / 5, The distribution map of the sampling points obtained, and the position vectors corresponding to these sampling points can be used as the projection direction of the perspective projection.
...
PUM
![No PUM](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com