Multi-protocol high-speed pseudo-random signal loopback test system based on FPGA

Abstract

The invention discloses a multi-protocol high-speed pseudorandom signal loopback test system based on an FPGA. The system comprises an FPGA part and an upper computer part; the FPGA part is connectedwith the upper computer part through a USB interface, and the FPGA part comprises an FPGA chip, two four-channel small optical fiber pluggable transceivers, eight single-channel optical fiber pluggable transceivers, a dual-channel USB chip and a programmable crystal oscillator; the upper computer part comprises a flow rate control module, a random number seed generation module, a data flow direction definition module, a programmable crystal oscillator control module, a rate error rate calculation module, a data flow protocol redefinition module, a USB data framing module, a USB data de-framingmodule, a USB driver and a graphical user interface display module. The invention provides three different loopback test modes to meet the requirements of different tested systems, and has a very high application value in the performance test of a high-speed communication system.

Description

technical field [0001] The invention belongs to the field of signal detection and relates to an FPGA-based multi-protocol high-speed pseudo-random signal loopback test system. Background technique [0002] With the continuous improvement of the speed of the communication system, higher requirements are put forward for the test system. It is often required that the test system can generate a test data flow of more than 100Gb / s, and can detect performance indicators such as communication rate and bit error rate in real time. With its high-speed parallel processing capability, FPGA has been widely used in digital signal processing, high-speed communication, artificial intelligence and other fields. With the continuous development of FPGA technology, integrated high-speed serial transceivers inside the chip have become the mainstream, which provides a hardware basis for generating high-speed data streams. [0003] For most of the existing high-speed communication systems, the d...

AI Technical Summary

Problems solved by technology

Due to the randomness and complexity of the data interface of the communication system, most of the existing test systems are customized according to the needs, generally only support a single protocol and a single test mode, and the reuse rate is low, while the test systems on the market that meet the requirements tend to be more expensive

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