Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A memory testing device and system

A memory test and memory technology, applied in the field of memory, can solve the problem of low test efficiency and achieve the effect of improving test efficiency

Active Publication Date: 2022-01-04
JIANGSU XINSHENG INTELLIGENT TECH CO LTD
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of this application is to provide a memory test device to solve the problem of low test efficiency in the prior art when the memory is directly tested by the test machine
[0006] Another object of the present application is to provide a memory test system to solve the problem of low test efficiency in the prior art when the memory is directly tested by the test machine

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A memory testing device and system
  • A memory testing device and system
  • A memory testing device and system

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0030] As mentioned in the background art, the existing memory generally needs to be tested after production. For example, OTP (One Time Programmable, one-time programmable) memory, generally speaking, the tests that the integrated OTP chip needs to do during the machine test stage include:

[0031] 1. Blank Check Test, the purpose of this test is to detect whether the chip storage space is all zero, if it is detected that the storage space is all zero, then the chip should be classified as a good chip; if it is detected as 1 bits, then this chip should be classified as scrap.

[0032] 2. Word Line and Bit Line Integrity Test (Word Line and Bit Line Integrity Test), the purpose of this test is to detect the integrity of the word line and bit line in the OTP storage space and whether the corresponding peripheral circuits have serious defects.

[0033] 3. Pre-program Test (Pre-program Test), the purpose of this test is to screen out chips with serious defects in the programming...

no. 2 example

[0068] see figure 1 and figure 2 , the embodiment of the present invention also provides a memory test system, the memory test system includes a test machine 200, a memory 300 to be tested and the memory test device 100 described in the first embodiment, the test machine 200, the memory test device 100 And the memory 300 to be tested is connected in sequence, and the testing machine 200 is used to test the memory 300 to be tested by the memory testing device 100 . Since the first embodiment has described the hardware of the memory testing device 100 and the corresponding working principle in detail, so this embodiment will not repeat it here.

[0069] In summary, the present invention provides a memory testing device and system. The memory testing system also includes a test machine and a memory to be tested. The memory testing device includes a register component, a command analysis component, a test control component, a test result acquisition component, and a register com...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The application provides a memory testing device and system, which relate to the field of memory. The memory testing device includes a register component, a command analysis component, a test control component, and a test result acquisition component. The register component is used to receive the test command sent by the test machine, and generates a control command according to the test command. The command analysis component is used for the control command. Parsing and generating a test trigger signal to control the work of the test control component, the test control component is used to generate a test sequence during operation to test the memory to be tested, and the test result acquisition component is used to obtain the test result of the memory to be tested, and The test result is sent to the register component, so that the test machine determines whether the memory to be tested is qualified by reading the test result. The memory testing device and system provided by the present application have the advantage of improving testing efficiency.

Description

technical field [0001] The present application relates to the field of memory, in particular, to a memory testing device and system. Background technique [0002] A memory is a memory component used to store data and instructions in an electronic computer. Currently, due to the popularization of computers, memory is also widely used. [0003] After the memory is manufactured, it is generally necessary to test the memory to ensure that all the memories put into use are good chips. [0004] At present, the traditional test method is to realize the test by building a test environment on the test machine. However, when testing is required, the test environment needs to be built after complex debugging on the test machine, so the test efficiency for memory is not high. . Contents of the invention [0005] The purpose of the present application is to provide a memory testing device to solve the problem in the prior art that the testing efficiency is not high when the memory i...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 刘海亮
Owner JIANGSU XINSHENG INTELLIGENT TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com