A Hardware Trojan Detection Method Based on Lifting Algorithm

Abstract

The invention discloses a hardware Trojan detection method based on a lifting algorithm. The first and second controllability values ​​and the observability values ​​of each node of the integrated circuit are obtained by processing according to the topology of the integrated circuit; the first and second controllability values ​​and the observability values ​​of each node of the integrated circuit are Based on density clustering, a matrix with class distances is obtained; a weak classifier is used for training classification, and the weak classifiers are combined to obtain a final classifier, and then a matrix X' with class distances obtained by processing the integrated circuit to be tested is used by the final classifier Processing is performed to obtain the hardware Trojan detection result of the integrated circuit to be tested. The present invention has higher accuracy than the bypass analysis method under the condition of large sample.

Description

technical field [0001] The invention belongs to the technical field of integrated circuit detection, and in particular relates to a hardware Trojan detection method based on a lifting algorithm. Background technique [0002] With the continuous development of the information society, the scale of integrated circuits is increasing explosively, and its security is constantly being challenged. A hardware Trojan refers to a circuit component that is deliberately added to a hardware circuit, or a defect or hidden danger that is unintentionally left in the process of developing an integrated circuit. Compared with traditional software Trojans, hardware Trojans have the characteristics of concealment, low trigger rate, complex mechanism of action, and great harm once triggered. [0003] The existing hardware Trojan detection technologies are mainly divided into four categories, namely, physical detection and bypass analysis that require tools, and four categories of technologies b...

AI Technical Summary

Problems solved by technology

The functional test method requires an automatic test platform, which is tested by an exhaustive method of input test vectors, but due to the relatively large test time and test quantity, the application range is limited

Built-in self-test technology does not require external tools, but modules for testing must be added in the production process of the chip, and the detection of the overall circuit cannot be realized

Physical testing and bypass analysis require the use of high-precision testing instruments. The main feature of physical testing is reverse engineering analysis, but it is only suitable for chips with relatively simple structures, but because it requires more investment and testing time-consuming, and uncommonly used

The detection accuracy of bypass analysis is high, and at the same time, there are relatively few conditional restrictions, and the detection can be realized without triggering the Trojan horse. However, the physical quantities required by bypass analysis are difficult to observe accurately and are easily affected by noise, so its practical application is also difficult. subject to limitations

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