Memory module automatic test equipment

Abstract

The invention provides memory module automatic testing equipment. The equipment comprises a rack platform and at least one group of testing mechanisms arranged on the rack platform, wherein each testing mechanism comprises a manipulator, an X-direction moving carrying station, a Y-direction moving carrying station, an X-direction material box module, a Y-direction material box module, a labeling machine, a code scanning gun, an ion fan and a memory testing instrument; the X-direction material box module corresponds to the underside of the X-direction moving carrying station, and comprises a first X-direction material box group, a second X-direction material box group and a third X-direction material box group, wherein the third X-direction material box group and the Y-direction material box module are linearly and correspondingly distributed under the Y-direction moving carrying station; the Y-direction material box module comprises a first Y-direction material box group, a second Y-direction material box group and a third Y-direction material box group, and the manipulator, the labeling machine, the code scanning gun, the ion fan and the memory testing instrument are arranged on the right-angle inner side of the X-direction material box module and the Y-direction material box module. The equipment can greatly improve the automation degree of the memory module, thus greatly improving the testing efficiency.

Description

technical field [0001] The invention relates to a testing device, in particular to a memory stick automatic testing device. Background technique [0002] Memory is an essential accessory for servers and storage, and its compatibility with the motherboard directly determines the stability of the memory link. If this link cannot be well designed and verified, it will lead to a series of memory compatibility issues, and compatibility issues involve various aspects such as board design, process technology, and environmental factors. Therefore, the test verification of memory becomes particularly important. [0003] At present, most of the testing of memory sticks is still in a low-efficiency state of manual operation, which cannot meet the needs of mass production for rapid inspection of qualified memory, which leads to delays in memory testing for production. [0004] Therefore be badly in need of a kind of memory stick automatic test equipment that can greatly improve the de...

AI Technical Summary

Problems solved by technology

[0003] At present, most of the testing of memory sticks is still in a low-efficiency state of manual operation, which cannot meet the needs of mass production for rapid inspection of qualified memory, which leads to delays in memory testing for production.

Images