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A Method of Controlling Integral Time of CCD Photodetector with Adaptive Light Intensity

A photodetector, integration time technology, used in adaptive control, spectrometry/spectrophotometry/monochromator, optical radiometry, etc., can solve the problem of slow speed, weak environmental adaptability, and inability to eliminate dark noise Influence and other issues, to achieve the effect of fast speed and high precision

Active Publication Date: 2021-07-16
CHINA ELECTRONIS TECH INSTR CO LTD
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Problems solved by technology

[0004] In the prior art, the integration time of the spectrometer is usually set manually, that is, the integration time is manually set according to the collected signals and empirical values. The disadvantage of manual setting of the integration time is slow speed and weak environmental adaptability
And the manual setting method cannot eliminate the influence of dark noise on the output signal, thus affecting the precision and accuracy of spectral measurement

Method used

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  • A Method of Controlling Integral Time of CCD Photodetector with Adaptive Light Intensity
  • A Method of Controlling Integral Time of CCD Photodetector with Adaptive Light Intensity

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Embodiment Construction

[0026] In order to facilitate the understanding of the present invention, the present invention will be described in more detail below in conjunction with the accompanying drawings and specific embodiments. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described in this specification. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0027] The CCD photodetector integration time control method of adaptive light intensity provided by this embodiment, the process is as follows figure 1 As shown, the specific steps are as follows:

[0028] Step1: Parameter initialization. According to the maximum and minimum integration time provided by the CCD when it leaves the factory, set the initial integration time as t i , where t min i max ;...

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Abstract

The invention belongs to the technical field of photoelectric testing and relates to a method for controlling the integration time of a CCD photodetector. A CCD photodetector integration time control method of adaptive light intensity, comprising (1): initial integration time is set as t i , where t min <t i <t max ;(2): collect spectral signal [s 1 ,s 2 ..., s m ], calculate the spectral signal mean s avg ;(3): Acquisition and calculation of spectral noise σ dark ;(4): judge s avg and δ·σ dark , δ is the influence factor of dark noise: if s avg <δ·σ dark , set the integration time to t j , t min <t j <t max , and t j ≠t i , and go to step (1); if s avg ≥δ·σ dark , denoise the spectral signal first, and then set the integration time. The method of the present invention adjusts the integration time adaptively according to the light intensity, and simultaneously considers the influence of dark noise on the output signal to adjust the integration time adaptively. Scenes.

Description

technical field [0001] The invention belongs to the technical field of photoelectric testing and relates to a method for controlling the integration time of a CCD photodetector. Background technique [0002] As the light-receiving device in the spectrum analyzer, the CCD photodetector can realize the photoelectric conversion of the signal, and has become the focus of research due to its advantages of low power consumption, low operating voltage, stable performance, high sensitivity, and large dynamic range. With the miniaturization and intelligent development of the spectrometer, higher requirements are put forward for the control of the integration time of the CCD photodetector. [0003] The electrical signal output by the CCD photodetector is proportional to the light intensity and the integration time. Under the condition of a certain integration time, when the light intensity is too strong, the signal overflows, which causes the measured spectrum to be distorted; when th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/02G05B13/04
CPCG01J3/02G05B13/042
Inventor 鞠军委徐桂城吴威徐玉华张一琪陈晓峰聂建华张志辉闫继送
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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