Dark-field microscope in interference-scattering enhancement mode

Abstract

The invention discloses a dark-field microscope in an interference-scattering enhancement mode. The dark-field microscope comprises a light source for emitting light, a reflection light path composedof a plurality of reflectors, and a detection device arranged above a sample to be tested, the light source emits parallel beams, the parallel beams enter the reflection light path after passing through the sample to be tested, and pass through the sample to be tested again after passing through the reflection light path in the form of parallel beams, and the sample to be tested generates scattering to be detected by the detection device. Compared with the prior art, the technical scheme of the invention has the advantages of simple structure, convenient operation, sensitive detection, high reliability and the like. Compared with the existing dark-field microscope, the dark-field microscope disclosed by the invention has the advantages of significantly improving the resolution and the application range of the microscope, meeting the nanometer-scale observation and imaging requirements, having low construction cost, and being able to be popularized and applied in ordinary laboratories.

Description

technical field [0001] The invention relates to the technical field of dark field microscopes, in particular to a dark field microscope in an interference-scattering enhanced mode. Background technique [0002] In the field of life science technology, in order to study the interaction between nano-drugs and tumor cells and the nano-scale extracellular vesicles secreted by cells, the use of microscopic imaging technology is an essential technical means. The existing technology usually uses molecular fluorescence The representative spectral analysis method has the advantages of real-time, in-situ, and non-invasive, and thus has been widely used in the field of life analysis technology. time, and inevitably interfere with the behavior of the research subjects, and even cause the death of the research subjects. [0003] In order to solve the above-mentioned technical problems in fluorescence analysis, dark-field microscopes emerged as the times require. Dark-field microscopes h...

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Problems solved by technology

[0005] In order to overcome the problems in the dark-field digital holographic microscopy illumination light in the prior art, such as poor controllability of the inner and outer radius of the ring-shaped illumination light, uneven light waves, weak imaging contrast, and a large loss of light energy, and to improve the system Resolution, enhanced contrast of reproduced images, Chinese patent (publication number CN107907983A) discloses a digital holographic microscope device and its working method based on local hollow beam illumination. The Bessel beam is focused by the lens to form a local hollow beam, and then the generated local hollow beam enters the dark field condenser and forms an annular light cone to illuminate the experimental sample to obtain the scattered light of the object, and then the digital holography will disperse the scattered light of the object The light interferes with the spherical wave reference light, and the interfering fringes are recorded into the computer through the photoelectric coupling device. However, the patented technical solution still has the unevenness of the light wave of the illumination beam in the dark field microscope, the large background signal, a large loss of light power, and poor imaging contrast. and other technical problems, and the patented technical solution uses a cone mirror to form a non-diffraction-like Bessel beam and a local hollow beam formed by lens focusing. The resolution cannot be further improved through multiple optical path interferences. After multiple optical path interferences, it will serious image distortion

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