A method and system for measuring the refractive index of particles using the polarization difference of scattered light

Abstract

The invention discloses a method and system for measuring the refractive index of particles by using the polarization difference of scattered light, the method includes obtaining the vertically polarized scattered light energy distribution E ⊥ and horizontally polarized scattered light energy distribution E || , calculate the scattered light energy distribution polarization difference E d ;According to Mie theory, calculate a set refractive index value n (i) Calculate the particle size distribution W (i) , to obtain the polarization difference of scattered light and calculate E d mean square error σ of (i) , change the value of the refractive index, repeat the above process, and obtain the refractive index with the smallest mean square error, which is the real refractive index of the particle. The particle size distribution calculated using this refractive index is the real particle size distribution of the particle. A method for realizing the above is also provided In the present invention, when the refractive index and particle size distribution of the measured particle sample are unknown, the scattered light signal itself obtained by the laser particle size analyzer can be used to calculate the refractive index of the sample, and then obtain an accurate sample particle size distribution.

Description

technical field [0001] The invention relates to the technical field of particle characterization, in particular to a method and system for measuring the refractive index of particles by using the polarization difference of scattered light. Background technique [0002] Particles refer to geometric bodies with a specific shape generally between millimeters and nanometers in size. Particles not only refer to solid particles, but also fluid particles such as mist droplets and bubbles. Particles are ubiquitous in nature and widely affect or apply to industrial production and scientific research. Particle size is one of the most important parameters of particles. In recent years, the application of various new granular materials has higher requirements for particle size measurement. Laser particle size analyzers based on the principle of static light scattering have been used more and more widely. [0003] According to the geometrical optics approximation theory of light scatt...

AI Technical Summary

Problems solved by technology

However, the refractive index of the actual sample is related to factors such as the wavelength of the incident light and the content of impurities, so it is difficult to determine the exact refractive index of the particles, which often leads to a large error between the measurement results of the sample and the actual particle size distribution

[0005] So far, although there have been several methods for measuring the refractive index using scattered light signals, all of them have limitations of one kind or another

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