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Single-event latch-up protection device and latch-release method for charge measurement chip

A single-event latch and protective device technology, applied in the field of space electronics, can solve the problems of limited optional models, inoperability, and high price, and achieve the effect of quick recovery of work tasks

Active Publication Date: 2021-05-11
INST OF MODERN PHYSICS CHINESE ACADEMY OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, fully using high-grade devices is often not operable in space detection systems. Some special charge measurement chips are limited to scientific experiments, and there are no aerospace-grade devices, or the performance of aerospace-grade devices often lags behind commercial devices of the same period. 2~3 generations, price Expensive, limited models available, and long lead times, and there may be obstacles such as foreign embargoes

Method used

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  • Single-event latch-up protection device and latch-release method for charge measurement chip
  • Single-event latch-up protection device and latch-release method for charge measurement chip
  • Single-event latch-up protection device and latch-release method for charge measurement chip

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Effect test

Embodiment 1

[0030] A single event latch-up protection device for a charge measurement ASIC chip provided in this embodiment, the device includes:

[0031] A single event latch release device for automatically releasing the single event latch;

[0032] Single-event latch-up current limiter to suppress excessive latch-up current.

[0033] Specifically, such as figure 1 As shown, the single event latch release device consists of:

[0034] The power supply unit uses an independent LDO (Low Dropout Regulator, low dropout linear regulator) power supply chip to provide power supply for the charge measurement ASIC chip and related circuits, so that it does not affect the normal operation of other circuits on the board.

[0035] The current sampling circuit is used to sample the current of the power supply unit, wherein the current sampling circuit includes a current sampling probe, an operational amplifier OP and an analog-to-digital conversion device ADC, and the sampled power supply forms dif...

Embodiment 2

[0039] Such as Figure 4 As shown, the single event latch automatic release method of the charge measurement ASIC chip provided in this embodiment includes steps:

[0040] S1: The current sampling circuit samples the current of the power supply circuit of the power supply unit, and sends the sampled current value into the FPGA, and compares it with the preset current threshold. If the collected current is greater than the set threshold, it is considered as charge measurement The chip latches up;

[0041] S2: The FPGA outputs a low level to the control signal terminal of the charge measurement ASIC chip to prevent the existence of a sneak-through path during power failure. After an interval of 20ns, the interval time is taken as an example, not limited to this; The power enable signal turns off the LDO power supply chip in the power supply unit of the charge measurement related circuit. During the power failure, the FPGA sets the power failure status register and starts the po...

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Abstract

The invention relates to a single event latch protection device and a latch release method for a charge measurement chip, characterized in that the device includes: a single event latch current limiting device for suppressing excessive latch current; a single event latch release Device for automatic release of single event latches. The invention can suppress the excessive increase of the current of the on-board electronic equipment when the single event latch occurs, and at the same time realize the automatic release of the circuit where the single event latch phenomenon occurs, and quickly restore the working task of the device without affecting the rest of the circuit Part of the normal work increases the work efficiency to the greatest extent and ensures the safety of the on-board electronic equipment.

Description

technical field [0001] The invention relates to a single-event latch protection device and a latch release method for a charge measurement chip, and relates to the technical field of space electronics. Background technique [0002] With the discovery of a series of high-energy celestial phenomena such as supernova explosions, X-ray pulsars, and gamma-ray bursts, the research on high-energy phenomena and high-energy processes in the universe has become increasingly active, and it has also driven the development of space detection technology. High-energy space detection technology mainly relies on the detection system to obtain parameters such as the energy and direction of X / γ-rays and charged particles. A general high-energy space detection system consists of two parts: a detector and a readout electronics system. Rays from space interact with detectors to generate electrical or optical signals, and the detectors convert them into current signals or voltage signals for outp...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H02H3/08H02H3/06H02H3/02
CPCH02H3/025H02H3/06H02H3/08
Inventor 孔洁杨海波赵红赟千奕苏弘牛晓阳方芳余玉洪孙志宇张永杰唐述文
Owner INST OF MODERN PHYSICS CHINESE ACADEMY OF SCI
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