Probe for semiconductor probe test bench
A test bench and semiconductor technology, which is applied in the direction of electronic circuit testing, measuring electronics, measuring devices, etc., can solve the problems of poor welding quality of finished product pins, differences in test results, and affecting test results, so as to reduce twisting force and improve accuracy. , to prevent the effect of piercing the wafer
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[0017] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0018] see Figure 1-3 , a semiconductor probe test bench probe, comprising a sleeve 1, a needle 2, the needle 2 is installed at the bottom of the sleeve 1, the interior of the sleeve 1 is fixedly installed with a positioning block 4, and the inner wall of the positioning block 4 is The needle head 2 is slidably connected, so that the needle head 2 can slide in different positions, the end of the needle head 2 is fixedly connected wit...
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