Image segmentation method and device for background detection

A technology of image segmentation and background detection, which is applied in image analysis, image enhancement, image data processing, etc., can solve the problems of destroying area boundaries, difficult image segmentation, and large amount of calculation, so as to ensure image quality, facilitate detection, reduce The effect of the number of features

Inactive Publication Date: 2019-11-05
GUANGZHOU UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There are many image segmentation methods combined with the threshold algorithm, but it is difficult to deal with the situation that contains multiple foreground objects; the current edge detection method cannot detect the edge of the foreground of the image well and make it continuous, and the edge exists between the background and the target. It depends on the edge operator, so it is difficult to be used in image segmentation; the region method mainly includes the region growing method and the split and merge method, and the split and merge method is considered to be a very promising segmentation method. The segmentation effect is better, but the algorithm is more complex, the amount of calculation is large, and the division may destroy the boundary of the region; the clustering method regards image segmentation as a clustering problem, and the clustering algorithm is widely used in image segmentation, but it needs to specify the clustering in advance. Number of classes, area size, and area homogeneity criteria
[0004] Therefore, based on the fact that the pixels of each point in the image background may have a large gap, it is difficult to directly use the threshold method to distinguish whether a point belongs to the background pixel, which will affect the accuracy of image segmentation.

Method used

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no. 1 example

[0021] For a first example, see figure 1 .

[0022] Such as figure 1 As shown, the image segmentation method based on background detection provided by the first embodiment includes the following steps S1-S5:

[0023] S1. Acquire N silicon wafer images taken by X-rays, where N is an integer greater than 1.

[0024] S2. Carry out color image segmentation on the N silicon wafer images respectively, and select a single-channel image with the highest contrast, and further grayscale, to obtain N first target images.

[0025] S3. Perform global thresholding processing on the N first target images, and further fill holes until there is no gap in the pixels, so as to obtain N second target images.

[0026] S4. Construct the connected domains of the N second target images according to the set pixel adjacency relationship, and further use the area characteristics of the silicon chip to filter out the silicon chip area to obtain N third target images.

[0027] S5. Perform a morphologi...

no. 2 example

[0047] The second embodiment is another embodiment based on the first embodiment.

[0048] Before acquiring the N silicon wafer images taken by X-rays, it also includes: calibrating the camera; specifically, initially adjusting the vertical height and focal length of the camera so that the four chamfers of the silicon wafer can be seen clearly The image of the grid; continue to adjust the vertical height and focus of the camera so that it captures an image just enough to clearly see all the dots on the calibration plate.

[0049] In a preferred embodiment, the size of the silicon wafers is 150mm×150mm or 156mm×156mm, and the size of the calibration plate is 170mm×170mm.

[0050] Taking an industrial camera as an example, adjust the vertical height and shooting angle of the industrial camera until the target object is within the shooting range of the industrial camera. In addition, adjust the focal length of the industrial camera until the boundary line of the target object ca...

no. 3 example

[0067] The third embodiment is another embodiment based on the first embodiment and the second embodiment.

[0068] Taking an industrial camera as an example, install the industrial camera at an appropriate position above the conveyor belt and place the silicon wafer to be tested on the conveyor belt.

[0069] In this embodiment, the vertical height and shooting angle of the industrial camera are adjusted until the size of the silicon wafer image captured by the industrial camera is 175-177 mm. In addition, adjust the focal length of the industrial camera until the four chamfered grid lines of the silicon wafer to be tested can be clearly photographed. At the same time, use a square calibration plate with a side length of 170mm, and adjust the focal length of the visual camera until all the dots on the calibration plate can be clearly photographed.

[0070] In a preferred embodiment, the N silicon wafer images are respectively captured by N cameras at the same time, wherein e...

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Abstract

The invention discloses an image segmentation method based on background detection. The method comprises the following steps: acquiring N silicon wafer images shot by X-ray; respectively carrying outcolor image segmentation on the N silicon wafer images, screening out a single-channel image with the maximum contrast ratio from the N silicon wafer images, and performing further graying to obtain Nfirst target images; carrying out global threshold processing on the N first target images, carrying out hole filling until no gap exists in pixels, and obtaining N second target images; constructinga connected domain of the N second target images according to a set pixel adjacency relation, and further screening out a silicon wafer region by utilizing the area characteristics of the silicon wafer to obtain N third target images; and performing morphological opening operation on the N third target images, reducing the definition domain of the N third target images to a set definition domain,and performing matting processing to obtain N target images. According to the method and device, the original image is subjected to series processing, so that the feature number is reduced on the premise of ensuring the image quality, and the target image is quickly segmented from the original image.

Description

technical field [0001] The invention relates to the field of machine vision detection, in particular to an image segmentation method and device for background detection. Background technique [0002] Image segmentation refers to the technology and process of extracting an image into a region of interest. Among them, typical image segmentation methods include threshold method, edge detection method, region method, clustering method and image segmentation methods combined with specific theories, but these methods always have some shortcomings when targeting different images. [0003] For example: the threshold algorithm is the most classic and commonly used method, and its advantages are simple implementation and fast operation speed. There are many image segmentation methods combined with the threshold algorithm, but it is difficult to deal with the situation that contains multiple foreground objects; the current edge detection method cannot detect the edge of the foreground...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/10G06T7/11G06T7/136G06T7/194G06T5/50
CPCG06T5/50G06T2207/10116G06T2207/20224G06T2207/30148G06T7/10G06T7/11G06T7/136G06T7/194
Inventor 谢宏威周聪陈从桂谢德芳杨成龙
Owner GUANGZHOU UNIVERSITY
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