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A method for testing low-frequency voltage/current fluctuation parameters of solar cell modules

A solar cell, low-frequency voltage technology, applied in the monitoring of electrical components, photovoltaic power generation, photovoltaic systems, etc., can solve the problems of single test mode and unsatisfactory test results, achieve accurate test collection, ensure accuracy and reliability Effect

Active Publication Date: 2021-07-23
成都金螺科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a low-frequency voltage / current fluctuation parameter test method for solar cell components, to sensitively and effectively measure the reliability of the device, and to solve the problem of single test mode and unsatisfactory test results in traditional solar cell test methods question

Method used

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  • A method for testing low-frequency voltage/current fluctuation parameters of solar cell modules
  • A method for testing low-frequency voltage/current fluctuation parameters of solar cell modules
  • A method for testing low-frequency voltage/current fluctuation parameters of solar cell modules

Examples

Experimental program
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Effect test

Embodiment 1

[0088] Forward bias low frequency voltage / current fluctuation signal test process, such as figure 1 Shown:

[0089] Step 1 After the test environment is set up, place the ground-use crystalline silicon photovoltaic cell module (maximum power 330W, open circuit voltage 45.1V, short circuit current 9.45A, maximum power point voltage 37.2V, maximum power point current 8.87A) in a shielded dark room , and ensure that there is no electromagnetic interference during the test.

[0090] Step 2 Connect the photovoltaic module under test to the forward bias low-frequency fluctuation signal test adaptation circuit. The positive voltage output terminal of the photovoltaic module is connected to the positive power supply terminal of the adapter through isolation and adjustment resistance, and the negative voltage output terminal of the photovoltaic module is connected to the Adapter negative power supply terminal, the adapter circuit such as figure 2 shown.

[0091] Step 3 Apply a forw...

Embodiment 2

[0098] Reverse bias low frequency voltage / current fluctuation signal test:

[0099] Step 1 Place the crystalline silicon photovoltaic cell module to be tested (maximum power 330W, open circuit voltage 45.1V, short circuit current 9.45A, maximum power point voltage 37.2V, maximum power point current 8.87A) in a shielded dark room, and ensure that the test The process is free from electromagnetic interference, such as figure 1 Shown:

[0100] Step 2 Connect the photovoltaic module under test to the reverse bias low-frequency voltage / current fluctuation signal test adaptation circuit. The negative voltage output terminal of the photovoltaic module is connected to the positive power supply terminal of the adapter through isolation and adjustment resistance, and the positive voltage output terminal of the photovoltaic module is The end is connected to the negative power supply end of the adapter, the adapter circuit such as image 3 shown.

[0101] Step 3 Apply a reverse bias vo...

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Abstract

The invention discloses a method for testing low-frequency voltage / current fluctuation parameters of a solar cell module. By placing the photovoltaic module under test in a dark room, applying a bias voltage, recording the bias current I and the bias voltage V, and testing the The voltage at both ends of the photovoltaic module is connected to the AC low-noise signal amplifier, and the low-frequency voltage fluctuation signal is collected and calculated to obtain the power spectral density data of the low-frequency voltage / current fluctuation of the photovoltaic module module under test; the point-frequency noise voltage value f is calculated separately n , RMS value of bandwidth noise voltage v n , 1 / f noise amplitude B, 1 / f noise corner frequency f c Parameters such as the noise spectrum value ratio μ, etc., are recorded in the low-frequency voltage / current fluctuation characteristic parameter table of the component under the bias current. The relevant information contained in the low-frequency voltage or current signal fluctuation signal proposed by the present invention can be used as one of the sensitive and non-destructive means for characterization and evaluation of solar cell life and reliability.

Description

technical field [0001] The invention belongs to the technical field of reliability research of electronic devices, and in particular relates to a method for testing low-frequency voltage / current fluctuation parameters of a solar battery module. Background technique [0002] Solar energy is a clean and renewable new energy source. As an alternative energy source, it is one of the best ways to solve the energy crisis and protect the environment. Due to the rapid development of the solar cell industry, on the one hand, how to improve the photoelectric conversion efficiency of solar cells and reduce production costs is the research focus of the development of the solar cell industry; on the other hand, in order to ensure the energy power of the system, the quality and reliability of solar cells are also became the focus of attention. However, in the process of product design and production, due to raw materials, process conditions, equipment conditions, and operators cannot alw...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H02S50/10
CPCH02S50/10Y02E10/50
Inventor 陈文豪廖宇龙
Owner 成都金螺科技有限公司
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