High speed acquisition system for frequency-temperature characteristics of multi-channel crystal oscillator and method thereof

Abstract

The invention discloses a high speed acquisition system for frequency-temperature characteristics of a multi-channel crystal oscillator. The high speed acquisition system comprises an industrial control computer, a parallel data acquisition unit, a frequency measurement control unit, a temperature control unit, test stations, and an external voltage stabilization source. Multiple test stations arearranged in the temperature control unit. The frequency measurement control unit is connected with the corresponding test stations via test station connecting wires. The frequency measurement controlunit is integrated to the parallel data acquisition unit through a network cable; the test stations are connected with the external voltage stabilization source by a soft cable wire; the temperaturecontrol unit and the industrial control computer are connected via a communication signal; and the industrial control computer is connected with the parallel data acquisition unit by a cable. Therefore, the frequency-temperature characteristics of the real-time working of the crystal oscillator can be characterized accurately. In addition, the invention also discloses an acquisition method of a high speed acquisition system for frequency-temperature characteristics of multi-channel crystal oscillator.

Description

technical field [0001] The invention relates to the field of automatic testing, more specifically it is a high-speed acquisition system for the frequency-temperature characteristics of multi-channel crystal oscillators. The invention also relates to a collection method of a high-speed collection system of frequency-temperature characteristics of a multi-channel crystal oscillator. Background technique [0002] The crystal oscillator is to use the piezoelectric effect of the quartz crystal to realize the frequency output through the positive feedback oscillation circuit. In modern electronic equipment, crystal oscillators are used as time or frequency reference sources, which are equivalent to the heart of electronic equipment. The temperature change of the working environment of electronic equipment will inevitably affect the working state and output frequency of the crystal oscillator. [0003] The crystal oscillator industry adopts an automated frequency-temperature char...

AI Technical Summary

Problems solved by technology

[0003] The crystal oscillator industry adopts an automated frequency-temperature characteristic test system to describe the frequency-temperature characteristics of the crystal oscillator by measuring the output frequency of the crystal oscillator at a certain temperature interval; this method cannot accurately characterize the frequency of the crystal oscillator when it is working in real time -Temperature characteristics

[0004] However, manual testing of the frequency-temperature characteristics of crystal oscillators under continuous working conditions has data misjudgment, low efficiency, and the problem that multiple crystal oscillators cannot be tested at the same time;

[0005] For the test requirements of batch products or long temperature cycle, it will inevitably form a test bottleneck; in addition, the original system fails to meet the high-speed acquisition requirements, and the abnormal frequency jump that occurs instantaneously will not be captured. It is also impossible to obtain convenient data recognition, and the short-term stability instruments available on the market usually only have a single channel and are expensive

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